SRF2015 - List of Authors (Sosa Guitron, S.I.)

Paper	Title	Page
TUPB060	Measurements of RF Properties of Thin Film Nb3Sn Superconducting Multilayers Using a Calorimetric Technique	720
	S.I. Sosa Guitron, J.R. Delayen, A.V. Gurevich ODU, Norfolk, Virginia, USA E. Chang Beom, C. Sundahl University of Wisconsin-Madison, Madison, USA G.V. Eremeev JLab, Newport News, Virginia, USA
	Funding: DOE Contract No. DE-AC05-06OR23177 DOE Grant No. DE-SC0010081 Results of RF tests of Nb3Sn thin film samples related to the superconducting multilayer coating development are presented. We have investigated thin film samples of Nb3Sn/Al2O3/Nb with Nb3Sn layer thicknesses of 50 nm and 100 nm using a Surface Impedance Characterization system. These samples were measured in the temperature range 4 K-19 K, where significant screening by Nb3Sn layers was observed below 16-17 K, consistent with the bulk critical temperature of Nb3Sn.
Export •	reference for this paper to ※ BibTeX, ※ LaTeX, ※ Text, ※ RIS/RefMan, ※ EndNote (xml)

Paper

Title

Page

Measurements of RF Properties of Thin Film Nb3Sn Superconducting Multilayers Using a Calorimetric Technique

720

S.I. Sosa Guitron, J.R. Delayen, A.V. Gurevich
ODU, Norfolk, Virginia, USA
E. Chang Beom, C. Sundahl
University of Wisconsin-Madison, Madison, USA
G.V. Eremeev
JLab, Newport News, Virginia, USA

Funding: DOE Contract No. DE-AC05-06OR23177 DOE Grant No. DE-SC0010081
Results of RF tests of Nb3Sn thin film samples related to the superconducting multilayer coating development are presented. We have investigated thin film samples of Nb3Sn/Al2O3/Nb with Nb3Sn layer thicknesses of 50 nm and 100 nm using a Surface Impedance Characterization system. These samples were measured in the temperature range 4 K-19 K, where significant screening by Nb3Sn layers was observed below 16-17 K, consistent with the bulk critical temperature of Nb3Sn.

Export •

reference for this paper to ※ BibTeX, ※ LaTeX, ※ Text, ※ RIS/RefMan, ※ EndNote (xml)