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RIS citation export for TUPB050: Secondary Electron Yield of SRF Materials

TY - CPAPER
AU - Aull, S.
AU - Junginger, T.
AU - Knobloch, J.
AU - Neupert, H.
TI - Secondary Electron Yield of SRF Materials
J2 - Proc. of International Conference on RF Superconductivity (SRF2015), Whistler, BC, Canada, Sept. 13-18, 2015
AB - The secondary electron yield (SEY) describes the number of electrons emitted to the vacuum per arriving electron at the surface. For a given geometry, the SEY is the defining factor for multipacting activity. In the quest of superconducting RF materials beyond bulk niobium, we studied the SEY of the currently most important candidates for future SRF applications: Nb3Sn, NbTiN and MgB2. All studies were done on clean but technical surfaces, i.e. on clean surfaces exposed to air and with their native oxides as it would be the case for SRF cavities.
PB - JACoW
CY - Geneva, Switzerland
SP - 686
EP - 690
KW - electron
KW - niobium
KW - SRF
KW - vacuum
KW - cavity
DA - 2015/12
PY - 2015
SN - 978-3-95450-178-6
DO - 10.18429/JACoW-SRF2015-TUPB050
UR - http://srf2015.vrws.de/papers/tupb050.pdf
ER -