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TY - CPAPER AU - Yang, Z.Q. AU - Lin, L. AU - Lu, X.Y. AU - Tan, W.W. AU - Yang, D.Y. AU - Zhao, J. TI - TOF-SIMS Study of Nitrogen Doping Niobium Samples J2 - Proc. of International Conference on RF Superconductivity (SRF2015), Whistler, BC, Canada, Sept. 13-18, 2015 AB - Nitrogen doping treatment with the subsequent electropolishing (EP) of the niobium superconducting cavity can significantly increase the cavity’s quality factor up to a factor of 3. The nitrogen doping experiment has been successfully repeated and demonstrated. But the mechanism of the nitrogen doping effect remains unclear. Nitrogen doping study on niobium samples was carried out in Peking University. The niobium samples were manual processed to avoid heat generation. The experiment condition is close to that of the Fermilab. After the nitrogen doping treatment, the samples were mildly electropolished with the thickness of 1.3μm, 1.9μm, 3.3μm, 4.2μm, 5.1μm, 5.9μm and 7.0μm. The time of flight secondary ion mass spectrometry (TOF-SIMS) measurements show that the samples directly after nitrogen doping have a much higher nitrogen concentration in the depth of about 90nm. When the EP removal is larger than 1.3μm, the samples’ impurity elements is remarkably reduced and their distribution is similar to each other. Also the measured results to some extent prove that EP removal can introduce H to the niobium surface. PB - JACoW CY - Geneva, Switzerland SP - 169 EP - 173 KW - niobium KW - experiment KW - cavity KW - vacuum KW - ion DA - 2015/12 PY - 2015 SN - 978-3-95450-178-6 DO - 10.18429/JACoW-SRF2015-MOPB036 UR - http://srf2015.vrws.de/papers/mopb036.pdf ER -