Author: Iwashita, Y.
Paper Title Page
TUPO032 Updates on R&D of Nondestructive Inspection Systems for SRF Cavities 447
 
  • Y. Iwashita, H. Tongu
    Kyoto ICR, Uji, Kyoto, Japan
  • H. Hayano, T. Saeki, K. Watanabe
    KEK, Ibaraki, Japan
 
  We are developing high resolution eddy current scan and High density Tmap and X-map. The high resolution eddy current scan showed 100 μm diameter hole with 50μm depth that was drilled on a Nb plate. The surface mount print circuit technology is applied to the high density Tmap and X-map devices, which will be ready soon to test at a vertical test bench. In addition, radiography using Xrays and neutrons are also under study. The results and status will be presented.  
poster icon Poster TUPO032 [2.362 MB]  
 
WEIOB02 Cavity Inspection and Repair Techniques 598
 
  • K. Watanabe, H. Hayano
    KEK, Ibaraki, Japan
  • Y. Iwashita
    Kyoto ICR, Uji, Kyoto, Japan
 
  The cavity inspection and repair techniques are important to study a quality control of the superconducting rf cavity for better yield with high accelerating gradient. A high-resolution camera system was developed for optical inspection in 2008. It enables 2-D analysis by image processing on inner surface of the cavity. Therefore, the cause to limit the cavity performance can be categorized into a geometrical defect or an assembly work and the surface treatment. In addition, by perfoming the optical inspection at each treatment, we can obtain an information when a defect appeared. The cavities that quenched at the low field were inspected. One or few geometrical defects were found around quench location on some of these cavities. It is a possibility that the cavity performance can be recovered by removing the geometrical defect at the quench location. A local grinding machine was developed for this purpose. This method was tested on the 9-cell cavities, and we succeeded to recover the cavity performance with combination of local grinding and light EP. The method and results of the cavity inspection as well as the replica techniques will be presented in this talk.