Author: Zuo, S.S.
Paper Title Page
MOPAC12 Analysis of High Repetition Rate Effects in Dielectric Wakefield Accelerators 93
 
  • P. Schoessow, S.P. Antipov, C.-J. Jing, A. Kanareykin, S.S. Zuo
    Euclid TechLabs, LLC, Solon, Ohio, USA
  • J.G. Power, A. Zholents
    ANL, Argonne, USA
 
  Recently the question has arisen of whether dielectric charging might become a significant limiting effect on the performance of the dielectric wakefield undulator, leading either to deflection of the beam by the static electric field generated, or to catastrophic breakdown of the structure. In experiments to date this has not been problematic with appropriate choice of dielectric material. However, given the high repetition rate that would be required, the device would be subjected to essentially a dc bombardment from the beam halo and thus be vulnerable to these effects because there is no time between machine pulses for discharge of the dielectric. We have begun reexamining this problem, emphasizing the expected charging rate and charge distribution in a thin walled dielectric device and the physics of conductivity and discharge phenomena in a dielectric medium. Simulations of the charging process and halo formation will be presented. We will review early work on beam-induced charging of dielectric structures and also results from deep charging of satellite components by cosmic rays. Ageing and induced conductivity under large radiation doses are also investigated.