Author: Okamura, M.
Paper Title Page
TUPHO01 The RHIC E-Lens Test Bench Experimental Results 580
 
  • X. Gu, Z. Altinbas, J.N. Aronson, E.N. Beebe, W. Fischer, D.M. Gassner, K. Hamdi, J. Hock, L.T. Hoff, P. Kankiya, R.F. Lambiase, Y. Luo, M. Mapes, J.-L. Mi, T.A. Miller, C. Montag, S. Nemesure, M. Okamura, R.H. Olsen, A.I. Pikin, D. Raparia, P.J. Rosas, J. Sandberg, Y. Tan, C. Theisen, P. Thieberger, J.E. Tuozzolo, W. Zhang
    BNL, Upton, Long Island, New York, USA
 
  Funding: Work supported by U.S. DOE under contract No DE-AC02-98CH10886 with the U.S. Department of Energy.
To commission some of the hard and software for the RHIC electron lenses (e-lenses), a test bench was built based on the EBIS test stand at BNL. After several months of operation, the electron gun, collector, high-voltage gun modulator, instrumentation, partial control system, and several software applications have been tested. The nominal DC beam current of 0.85 A was demonstrated and the electron beam transverse profiles were verified to be Gaussian. Some e-lens power supplies and the electronics for current measurement were also evaluated on the test bench. The properties of the cathode and the profile of the beam are measured. In this paper, we will present some experimental results.