PAC2013 - List of Authors (Jaski, Y.)

Paper	Title	Page
WEPSM14	Advanced X-ray Beam Position Monitor System Design at the APS	1079
	B.X. Yang, G. Decker, J.S. Downey, Y. Jaski, T.L. Kruy, S.-H. Lee, M. Ramanathan, F. Westferro ANL, Argonne, USA
	Funding: Work supported by U.S. Department of Energy, Office of Science, under Contract No. DE-AC02-06CH11357. As part of the Advanced Photon Source (APS) Upgrade, new x-ray beamline front ends are planned that include extensive integrated x-ray diagnostic capability. The design includes a grazing-incidence insertion device x-ray beam position monitor (GRID-XBPM) based on Cu K-edge x-ray fluorescence from x-rays striking a pair of copper absorbers. At a 1.0-degree grazing incidence angle, the XBPM assembly was designed to withstand two inline Undulator A devices operating at 150-mA beam current, a total power of 16 kW. A second x-ray BPM located outside of the accelerator enclosure monitors back fluorescence from the beamline exit mask, which is a critical beamline-defining aperture. In addition, an intensity monitor is used to detect x-ray flux passing through a front-end mask inside the enclosure, while a second intensity monitor is located immediately downstream of the exit mask. Details of these designs and expected performance will be presented.

Paper

Title

Page

Advanced X-ray Beam Position Monitor System Design at the APS

1079

B.X. Yang, G. Decker, J.S. Downey, Y. Jaski, T.L. Kruy, S.-H. Lee, M. Ramanathan, F. Westferro
ANL, Argonne, USA

Funding: Work supported by U.S. Department of Energy, Office of Science, under Contract No. DE-AC02-06CH11357.
As part of the Advanced Photon Source (APS) Upgrade, new x-ray beamline front ends are planned that include extensive integrated x-ray diagnostic capability. The design includes a grazing-incidence insertion device x-ray beam position monitor (GRID-XBPM) based on Cu K-edge x-ray fluorescence from x-rays striking a pair of copper absorbers. At a 1.0-degree grazing incidence angle, the XBPM assembly was designed to withstand two inline Undulator A devices operating at 150-mA beam current, a total power of 16 kW. A second x-ray BPM located outside of the accelerator enclosure monitors back fluorescence from the beamline exit mask, which is a critical beamline-defining aperture. In addition, an intensity monitor is used to detect x-ray flux passing through a front-end mask inside the enclosure, while a second intensity monitor is located immediately downstream of the exit mask. Details of these designs and expected performance will be presented.