2011 Particle Accelerator Conference - List of Authors (Shin, I.)

Paper	Title	Page
WEP048	Comparison of RF Cavity Transport Models for BBU Simulations	1582
	I. Shin University of Connecticut, Storrs, Connecticut, USA S. Ahmed, T. Satogata, B.C. Yunn JLAB, Newport News, Virginia, USA
	The transverse focusing effect in RF cavities plays a considerable role in beam dynamics for low-energy beamline sections and can contribute to beam breakup (BBU) instability. The purpose of this analysis is to examine RF cavity models in simulation codes which will be used for BBU experiments at Jefferson Lab and improve BBU simulation results. We review two RF cavity models in the simulation codes elegant and TDBBU (a BBU simulation code developed at Jefferson Lab). elegant can include the Rosenzweig-Serafini (R-S) model for the RF focusing effect. Whereas TDBBU uses a model from the code TRANSPORT which considers the adiabatic damping effect, but not the RF focusing effect. Quantitative comparisons are discussed for the CEBAF beamline. We also compare the R-S model with the results from numerical simulations for a CEBAF-type 5-cell superconducting cavity to validate the use of the R-S model as an improved low-energy RF cavity transport model in TDBBU. We have implemented the R-S model in TDBBU. It will cause BBU simulation results to be better matched with analytic calculations and experimental results.

WEP085	Beam Breakup Studies for New Cryo-Unit	1633
	S. Ahmed, F.E. Hannon, A.S. Hofler, R. Kazimi, G.A. Krafft, F. Marhauser, B.C. Yunn JLAB, Newport News, Virginia, USA I. Shin University of Connecticut, Storrs, Connecticut, USA
	In this paper, we report the numerical simulations of cumulative beam breakup studies for a new cryo-unit for injector design at Jefferson lab. The system consists of two 1-cell and one 7-cell superconducting RF cavities. The study has been performed using a 2-dimensional time-domain code TDBBU developed in-house. The stability has been confirmed for the present setup of beamline elements with different initial offsets and currents ranging 1 mA - 100 mA.

Paper

Title

Page

Comparison of RF Cavity Transport Models for BBU Simulations

1582

I. Shin
University of Connecticut, Storrs, Connecticut, USA
S. Ahmed, T. Satogata, B.C. Yunn
JLAB, Newport News, Virginia, USA

The transverse focusing effect in RF cavities plays a considerable role in beam dynamics for low-energy beamline sections and can contribute to beam breakup (BBU) instability. The purpose of this analysis is to examine RF cavity models in simulation codes which will be used for BBU experiments at Jefferson Lab and improve BBU simulation results. We review two RF cavity models in the simulation codes elegant and TDBBU (a BBU simulation code developed at Jefferson Lab). elegant can include the Rosenzweig-Serafini (R-S) model for the RF focusing effect. Whereas TDBBU uses a model from the code TRANSPORT which considers the adiabatic damping effect, but not the RF focusing effect. Quantitative comparisons are discussed for the CEBAF beamline. We also compare the R-S model with the results from numerical simulations for a CEBAF-type 5-cell superconducting cavity to validate the use of the R-S model as an improved low-energy RF cavity transport model in TDBBU. We have implemented the R-S model in TDBBU. It will cause BBU simulation results to be better matched with analytic calculations and experimental results.

WEP085

Beam Breakup Studies for New Cryo-Unit

1633

S. Ahmed, F.E. Hannon, A.S. Hofler, R. Kazimi, G.A. Krafft, F. Marhauser, B.C. Yunn
JLAB, Newport News, Virginia, USA
I. Shin
University of Connecticut, Storrs, Connecticut, USA

In this paper, we report the numerical simulations of cumulative beam breakup studies for a new cryo-unit for injector design at Jefferson lab. The system consists of two 1-cell and one 7-cell superconducting RF cavities. The study has been performed using a 2-dimensional time-domain code TDBBU developed in-house. The stability has been confirmed for the present setup of beamline elements with different initial offsets and currents ranging 1 mA - 100 mA.