Author: Meyer, T.
Paper Title Page
MOP222 Operational Use of Ionization Profile Monitors in the Fermilab Main Injector 519
 
  • D.K. Morris, P. Adamson, D. Capista, I. Kourbanis, T. Meyer, K. Seiya, D. Slimmer, M.-J. Yang, J.R. Zagel
    Fermilab, Batavia, USA
 
  Funding: Operated by the Fermi Research Alliance, LLC under contract No. DE-AC02-07CH11359 with the United States Department of Energy.
Ionization profile monitors (IPMs) are used in the Fermilab Main Injector (MI) for injection lattice matching and to measure transverse emittance of the beam during acceleration. The IPMs provide a periodic, non-destructive means for emittance measurements where other techniques are not applicable. As Fermilab is refocusing its attention on the intensity frontier, non-intercepting diagnostics such as IPMs are expected to become even more important. This paper gives an overview of the operational use of IPMs for emittance measurements and injection lattice matching measurements at Fermilab, and summarizes the future plans.