2011 Particle Accelerator Conference - List of Authors (Insepov, Z.)

Paper	Title	Page
TUP005	Comparison of Back-scattering Properties of Electron Emission Materials	817
	Z. Insepov, V. Ivanov, S.J. Jokela, M. Wetstein ANL, Argonne, USA
	We use “microscopic” Monte Carlo (MC) simulations, empirical theories, and comparison with experiments to identify the influence of back-scattered electrons and the saturation effect on the emissive properties of materials and to study the gain and transit times for various microchannel plates (MCPs). We have applied this method to Al2O3 and MgO emissive materials of various thickness and surface quality. The experimental secondary emission yield (SEY) data were obtained at normal electron impacts and were used as the reference data for adjusting our MC simulations. The SEY data were calculated at oblique angles of the primary electrons in the interval of 0-80 degrees. The energy dependence of backscattered electron coefficients (BSCs) for various primary electron incidence angles was calculated by MC for both materials, and the results were compared with experimental “average” values obtained in the literature. Both SEY and BSC data were used as input files to our “macroscopic” trajectory simulation, which models MCP amplifiers as whole devices and is capable of gain and transit time calculations.

TUP049	Vacuum Arcs and Gradient Limits	895
	J. Norem, Z. Insepov ANL, Argonne, USA A. Moretti Fermilab, Batavia, USA
	Funding: DOE/OHEP We have been extending and refining our model of vacuum breakdown and gradient limits and will describe recent developments. The model considers a large number of mechanisms but finds that vacuum arcs can be described fairly simply and self consistently, however simulations of individual mechanisms can be, in some cases, involved. Although based on accelerator rf data, we believe our model of vacuum arcs should have general applicability.

Paper

Title

Page

Comparison of Back-scattering Properties of Electron Emission Materials

817

Z. Insepov, V. Ivanov, S.J. Jokela, M. Wetstein
ANL, Argonne, USA

We use “microscopic” Monte Carlo (MC) simulations, empirical theories, and comparison with experiments to identify the influence of back-scattered electrons and the saturation effect on the emissive properties of materials and to study the gain and transit times for various microchannel plates (MCPs). We have applied this method to Al2O3 and MgO emissive materials of various thickness and surface quality. The experimental secondary emission yield (SEY) data were obtained at normal electron impacts and were used as the reference data for adjusting our MC simulations. The SEY data were calculated at oblique angles of the primary electrons in the interval of 0-80 degrees. The energy dependence of backscattered electron coefficients (BSCs) for various primary electron incidence angles was calculated by MC for both materials, and the results were compared with experimental “average” values obtained in the literature. Both SEY and BSC data were used as input files to our “macroscopic” trajectory simulation, which models MCP amplifiers as whole devices and is capable of gain and transit time calculations.

TUP049

Vacuum Arcs and Gradient Limits

895

J. Norem, Z. Insepov
ANL, Argonne, USA
A. Moretti
Fermilab, Batavia, USA

Funding: DOE/OHEP
We have been extending and refining our model of vacuum breakdown and gradient limits and will describe recent developments. The model considers a large number of mechanisms but finds that vacuum arcs can be described fairly simply and self consistently, however simulations of individual mechanisms can be, in some cases, involved. Although based on accelerator rf data, we believe our model of vacuum arcs should have general applicability.