2011 Particle Accelerator Conference - List of Authors (Asner, D.)

Paper	Title	Page
TUP230	In-situ Secondary Electron Yield Measurement System at CesrTA	1253
	Y. Li, J.V. Conway, S. Greenwald, J.-S. Kim, V. Medjidzade, T.P. Moore, M.A. Palmer, C.R. Strohman CLASSE, Ithaca, New York, USA D. Asner Carleton University, College of Natural Sciences, Ottawa, Ontario, Canada
	Funding: Work Supported by NSF Grant #PHY-0734867 & DOE Grant #DE-FC02-08ER41538 Measuring the secondary electron yield (SEY) on technical surfaces in accelerator vacuum systems provides essential information for the study of electron cloud growth and suppression, with application to many accelerator R&D projects. As a part of the CesrTA research program, we developed and deployed an in-situ SEY measurement system. A two-sample SEY system was installed in the CesrTA vacuum system with one sample exposed to direct synchrotron radiation (SR) and the other sample exposed to scattered SR. The SEYs of both samples were measured as a function of the SR dosages. In this paper, we describe the in-situ SEY measurement systems and the initial results on bare aluminum (6061-T6), TiN-coated aluminum, amorphous carbon-coated aluminum, and amorphous carbon-coated copper samples.

Paper

Title

Page

In-situ Secondary Electron Yield Measurement System at CesrTA

1253

Y. Li, J.V. Conway, S. Greenwald, J.-S. Kim, V. Medjidzade, T.P. Moore, M.A. Palmer, C.R. Strohman
CLASSE, Ithaca, New York, USA
D. Asner
Carleton University, College of Natural Sciences, Ottawa, Ontario, Canada

Funding: Work Supported by NSF Grant #PHY-0734867 & DOE Grant #DE-FC02-08ER41538
Measuring the secondary electron yield (SEY) on technical surfaces in accelerator vacuum systems provides essential information for the study of electron cloud growth and suppression, with application to many accelerator R&D projects. As a part of the CesrTA research program, we developed and deployed an in-situ SEY measurement system. A two-sample SEY system was installed in the CesrTA vacuum system with one sample exposed to direct synchrotron radiation (SR) and the other sample exposed to scattered SR. The SEYs of both samples were measured as a function of the SR dosages. In this paper, we describe the in-situ SEY measurement systems and the initial results on bare aluminum (6061-T6), TiN-coated aluminum, amorphous carbon-coated aluminum, and amorphous carbon-coated copper samples.