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Paraliev, M.

Paper Title Page
TUP097 Measurements and Modeling at the PSI-XFEL 500 kV Low-Emittance Electron Source 630
  • T. Schietinger, A. Adelmann, Å. Andersson, M. Dietl, R. Ganter, C. Gough, C.P. Hauri, R. Ischebeck, S. Ivkovic, Y. Kim, F. Le Pimpec, S.C. Leemann, K.B. Li, P. Ming, A. Oppelt, M. Paraliev, M. Pedrozzi, V. Schlott, B. Steffen, A.F. Wrulich
    PSI, Villigen

Paul Scherrer Institute (PSI) is presently developing a low emittance electron source for the PSI-XFEL project. The electron gun consists of an adjustable diode configuration subject to pulses of 250 ns (FWHM) with amplitude up to 500 kV from an air-core transformer- based high-voltage pulser. The facility allows high gradient tests with different cathode configurations and emission processes (field emission and photo emission). In the first stage, the beamline is only made up of focussing solenoids followed by an emittance monitor. Selected beam characterization measurements, from photo-cathode operation driven by a 266 nm UV laser system delivering 4 uJ energy during 6.5 ps (FWHM), are presented and compared to the results of 3D particle tracking simulations.


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