Author: Wilde, S.
Paper Title Page
WEPHA053 Surface Resistance RF Measurements of Materials Used for Accelerator Vacuum Chambers 3235
 
  • P. Goudket, L. Gurran, O.B. Malyshev, M.D. Roper, R. Valizadeh, S. Wilde
    STFC/DL/ASTeC, Daresbury, Warrington, Cheshire, United Kingdom
  • G. Burt, L. Gurran
    Cockcroft Institute, Lancaster University, Lancaster, United Kingdom
  • P. Goudket, O.B. Malyshev, R. Valizadeh
    Cockcroft Institute, Warrington, Cheshire, United Kingdom
  • S. Wilde
    Loughborough University, Loughborough, Leicestershire, United Kingdom
 
  The RF surface resistance of accelerator vacuum chamber walls can have a significant impact on the beam quality. There is a need to know how the use of a new material, surface coating or surface treatment can affect the RF surface resistance. ASTeC and Lancaster University have designed and built two test cavities where one face can be replaced with a sample in the form of a flat plate. The measurements are performed with a network analyser at the resonant frequency of approximately 7.8 GHz.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2015-WEPHA053  
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WEPHA059 Physical Vapour Deposition of Thin Films for Use in Superconducting RF Cavities 3249
 
  • S. Wilde, B. Chesca
    Loughborough University, Loughborough, Leicestershire, United Kingdom
  • A.N. Hannah, D.O. Malyshev, O.B. Malyshev, S.M. Pattalwar, R. Valizadeh
    STFC/DL/ASTeC, Daresbury, Warrington, Cheshire, United Kingdom
  • G.B.G. Stenning
    STFC/RAL/ISIS, Chilton, Didcot, Oxon, United Kingdom
 
  The production of superconducting coatings for radio frequency cavities is a rapidly developing field that should ultimately lead to acceleration gradients greater than those obtained by bulk Nb RF cavities. Optimizing superconducting properties of Nb thin-films is therefore essential. Nb films were deposited by magnetron sputtering in pulsed DC mode onto Si (100) and MgO (100) substrates and also by high impulse magnetron sputtering (HiPIMS) onto Si (100), MgO (100) and polycrystalline Cu. The films were characterised using scanning electron microscopy, x-ray diffraction and DC SQUID magnetometry.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2015-WEPHA059  
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