Paper |
Title |
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WEPHA053 |
Surface Resistance RF Measurements of Materials Used for Accelerator Vacuum Chambers |
3235 |
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- P. Goudket, L. Gurran, O.B. Malyshev, M.D. Roper, R. Valizadeh, S. Wilde
STFC/DL/ASTeC, Daresbury, Warrington, Cheshire, United Kingdom
- G. Burt, L. Gurran
Cockcroft Institute, Lancaster University, Lancaster, United Kingdom
- P. Goudket, O.B. Malyshev, R. Valizadeh
Cockcroft Institute, Warrington, Cheshire, United Kingdom
- S. Wilde
Loughborough University, Loughborough, Leicestershire, United Kingdom
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The RF surface resistance of accelerator vacuum chamber walls can have a significant impact on the beam quality. There is a need to know how the use of a new material, surface coating or surface treatment can affect the RF surface resistance. ASTeC and Lancaster University have designed and built two test cavities where one face can be replaced with a sample in the form of a flat plate. The measurements are performed with a network analyser at the resonant frequency of approximately 7.8 GHz.
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DOI • |
reference for this paper
※ https://doi.org/10.18429/JACoW-IPAC2015-WEPHA053
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WEPHA059 |
Physical Vapour Deposition of Thin Films for Use in Superconducting RF Cavities |
3249 |
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- S. Wilde, B. Chesca
Loughborough University, Loughborough, Leicestershire, United Kingdom
- A.N. Hannah, D.O. Malyshev, O.B. Malyshev, S.M. Pattalwar, R. Valizadeh
STFC/DL/ASTeC, Daresbury, Warrington, Cheshire, United Kingdom
- G.B.G. Stenning
STFC/RAL/ISIS, Chilton, Didcot, Oxon, United Kingdom
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The production of superconducting coatings for radio frequency cavities is a rapidly developing field that should ultimately lead to acceleration gradients greater than those obtained by bulk Nb RF cavities. Optimizing superconducting properties of Nb thin-films is therefore essential. Nb films were deposited by magnetron sputtering in pulsed DC mode onto Si (100) and MgO (100) substrates and also by high impulse magnetron sputtering (HiPIMS) onto Si (100), MgO (100) and polycrystalline Cu. The films were characterised using scanning electron microscopy, x-ray diffraction and DC SQUID magnetometry.
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DOI • |
reference for this paper
※ https://doi.org/10.18429/JACoW-IPAC2015-WEPHA059
|
|
Export • |
reference for this paper using
※ BibTeX,
※ LaTeX,
※ Text/Word,
※ RIS,
※ EndNote (xml)
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