IPAC2015 - List of Authors (Tanimura, K.)

Paper	Title	Page
TUPWI008	RF Gun Based Ultrafast Electron Microscopy	2259
	J. Yang, K. Tanimura, Y. Yoshida ISIR, Osaka, Japan J. Urakawa KEK, Ibaraki, Japan
	Ultrafast electron microscopy (UEM) would be a powerful tool for the direct visualization of structural dynamic processes in matter. The resolutions of the observation on femtosecond time scales over sub-nanometer (even atomic) spatial dimensions have long been a goal in science. To achieve such resolutions, we have designed and constructed a femtosecond time-resolved relativistic-energy electron microscopy using a photocathode radio-frequency (RF) electron gun (RF based UEM). The RF gun has successfully generated a high-brightness electron beam with bunch length of 100 fs and emittance of 0.2 mm-mrad, which are essential beam parameters for the achievement of nm-fs space-time resolution in the microscopy. Both the static measurements of both relativistic-energy electron diffraction and image have been succeeded. In this presentation, the activities on RF based UEM are introduced. The requirements and limitations of the beam parameters are reviewed. The concept and design of RF based UEM are reported. Finally, some demonstrations of the relativistic-energy UEM images are reported.
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2015-TUPWI008
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Paper

Title

Page

RF Gun Based Ultrafast Electron Microscopy

2259

J. Yang, K. Tanimura, Y. Yoshida
ISIR, Osaka, Japan
J. Urakawa
KEK, Ibaraki, Japan

Ultrafast electron microscopy (UEM) would be a powerful tool for the direct visualization of structural dynamic processes in matter. The resolutions of the observation on femtosecond time scales over sub-nanometer (even atomic) spatial dimensions have long been a goal in science. To achieve such resolutions, we have designed and constructed a femtosecond time-resolved relativistic-energy electron microscopy using a photocathode radio-frequency (RF) electron gun (RF based UEM). The RF gun has successfully generated a high-brightness electron beam with bunch length of 100 fs and emittance of 0.2 mm-mrad, which are essential beam parameters for the achievement of nm-fs space-time resolution in the microscopy. Both the static measurements of both relativistic-energy electron diffraction and image have been succeeded. In this presentation, the activities on RF based UEM are introduced. The requirements and limitations of the beam parameters are reviewed. The concept and design of RF based UEM are reported. Finally, some demonstrations of the relativistic-energy UEM images are reported.

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2015-TUPWI008

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)