Author: Spentzouris, L.K.
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MOPMA039 Secondary Electron Yield Measurement and Electron Cloud Simulation at Fermilab 629
 
  • Y. Ji
    IIT, Chicago, Illinois, USA
  • L.K. Spentzouris
    Illinois Institute of Technology, Chicago, Illinois, USA
  • R.M. Zwaska
    Fermilab, Batavia, Illinois, USA
 
  Funding: This work was funded by the National Science Foundation under the grant no. 1205811.
Fermilab Main Injector is upgrading the accelerator to double the beam intensity from 24·1012 protons to 48·1012 protons, which brings the accelerator into a regime where electron cloud effects may limit the accelerator performance. In fact, an instability that could be caused by electron cloud effects has already been observed in the Recycler. Secondary Electron Yield (SEY) is an important property of the vacuum chamber material that has great influence on the process of building up free electrons. The Main Injector of the Fermilab accelerator complex offers the opportunity to measure SEY and conditioning effects in the environment of a running accelerator, since samples of these materials are located at the beampipe wall. The SEY of stainless steel (SS316L) and TiN coated SS316L in the proximity of the proton beam were measured and compared. A series of simulation studies of electron cloud build up were done for the Main Injector and Recycler using the code POSINST. Parametric studies were done to determine the maximum electron density vs. peak SEY at different beam intensities in the Fermilab Main Injector. Threshold simulations of electron cloud density verus SEY were extended from Main Injector to include the Recycler Ring. It was found that the electron cloud density around the beam depends on bunch location within the bunch train.
 
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2015-MOPMA039  
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TUPMA004 Synthesis of Ultra-Thin Single Crystal MgO/Ag/MgO Multilayer for Controlled Photocathode Emissive Properties 1846
 
  • D.G. Velázquez, R.L. Seibert, L.K. Spentzouris, J. Terry, Z.M. Yusof
    Illinois Institute of Technology, Chicago, Illinois, USA
 
  Photocathode emission properties are critical for electron beam applications such as photoinjectors for free electron lasers (FEL) and energy recovery Linacs (ERL). We investigate whether emission properties of photocathodes can be manipulated through the engineering of the surface electronic structure. The multilayers described here have been predicted to have emission properties in correlation with the film thickness. This paper describes how ultra-thin multilayered MgO/Ag/MgO films in the crystallographic orientations (001) and (111) multilayers were synthesized and characterized. Preliminary results of work function measurements are provided. Films were grown by pulsed laser deposition at 130 °C for the (001) orientation and 210 °C for the (111) orientation at a background pressure of ~ 5×10-9 Torr. Epitaxial growth was monitored in-situ using reflection high-energy electron diffraction, which showed single crystal island growth for each stage of the multilayer formation. Photoelectron spectroscopy was used to track the chemical state transition from Ag to MgO during the deposition of successive layers. The Kelvin probe technique was used to measure the change in contact potential difference, and thus work function, for various MgO layer thicknesses in comparison with bare single crystal Ag(001)and Ag(111) thin films. The work function was observed to reduce with increasing thickness of MgO from 0 to 4 monolayers as much as 0.89 eV and 0.72 eV for the (001) and (111) orientations, respectively. Photoelectron spectra near the Fermi level revealed electron density shifts toward zero binding energy for the multilayered surfaces with respect to the clean Ag surfaces.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2015-TUPMA004  
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