Author: Ji, Y.
Paper Title Page
MOPMA039 Secondary Electron Yield Measurement and Electron Cloud Simulation at Fermilab 629
 
  • Y. Ji
    IIT, Chicago, Illinois, USA
  • L.K. Spentzouris
    Illinois Institute of Technology, Chicago, Illinois, USA
  • R.M. Zwaska
    Fermilab, Batavia, Illinois, USA
 
  Funding: This work was funded by the National Science Foundation under the grant no. 1205811.
Fermilab Main Injector is upgrading the accelerator to double the beam intensity from 24·1012 protons to 48·1012 protons, which brings the accelerator into a regime where electron cloud effects may limit the accelerator performance. In fact, an instability that could be caused by electron cloud effects has already been observed in the Recycler. Secondary Electron Yield (SEY) is an important property of the vacuum chamber material that has great influence on the process of building up free electrons. The Main Injector of the Fermilab accelerator complex offers the opportunity to measure SEY and conditioning effects in the environment of a running accelerator, since samples of these materials are located at the beampipe wall. The SEY of stainless steel (SS316L) and TiN coated SS316L in the proximity of the proton beam were measured and compared. A series of simulation studies of electron cloud build up were done for the Main Injector and Recycler using the code POSINST. Parametric studies were done to determine the maximum electron density vs. peak SEY at different beam intensities in the Fermilab Main Injector. Threshold simulations of electron cloud density verus SEY were extended from Main Injector to include the Recycler Ring. It was found that the electron cloud density around the beam depends on bunch location within the bunch train.
 
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2015-MOPMA039  
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