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TY - CONF AU - Zhang, Z. AU - Tang, C.-X. ED - Henderson, Stuart ED - Akers, Evelyn ED - Satogata, Todd ED - Schaa, Volker R.W. TI - Numerical Simulation on Emittance Growth Caused by Roughness of a Metallic Photocathode J2 - Proc. of IPAC2015, Richmond, VA, USA, May 3-8, 2015 C1 - Richmond, VA, USA T2 - International Particle Accelerator Conference T3 - 6 LA - english AB - The roughness of a photocathode could lead to an additional uncorrelated divergence of the emitted electrons and therefore to an increased thermal emittance. The randomness of the real-life photocathode surface makes it unrealistic to perform typical beam dynamics simulation to study the roughness emittance growth. We developed a numerical simulation code based on the point spread function (PSF) and an estimated form of electric field distribution on an arbitrary gently undulating surface to deal with the problem. The simulation result surprisingly shows that the emittance growth factor is much smaller than expected (1.5 ~ 2). PB - JACoW CP - Geneva, Switzerland SP - 2559 EP - 2562 KW - simulation KW - emittance KW - electron KW - cathode KW - laser DA - 2015/06 PY - 2015 SN - 978-3-95450-168-7 DO - 10.18429/JACoW-IPAC2015-WEPWA028 UR - http://jacow.org/ipac2015/papers/wepwa028.pdf ER -