IPAC2014 - List of Authors (Tanimura, K.)

Paper	Title	Page
WEPRO103	Femtosecond Time-resolved Transmission Electron Microscopy using an RF Gun	2205
	J. Yang, M. Gohdo, K. Kan, T. Kondoh, K. Tanimura, Y. Yoshida ISIR, Osaka, Japan J. Urakawa KEK, Ibaraki, Japan
	The first prototype of RF gun based relativistic-energy electron microscopy has been constructed at Osaka University to study ultrafast structural dynamic processes in matter. The RF gun driven by a femtosecond laser has generated a 100-fs-pulse MeV electron beam with emittance of 0.1 mm-mrad and energy spread of 10^-4. Both the electron diffraction and image measurements have been succeeded in the prototype using the femtosecond electron beam. In the diffraction measurement, an excellent quality of diffraction pattern was acquired with electron number of 10⁶. The single-shot measurement is available in the prototype. In the image measurement, the TEM image was acquired with a total electron number of 10⁸. The magnification was 3,000 times. In the next step, we will reduce further the emittance to increase the beam brightness on the sample, and then improve the spatial resolution to <10 nm.
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2014-WEPRO103
Export •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

Paper

Title

Page

Femtosecond Time-resolved Transmission Electron Microscopy using an RF Gun

2205

J. Yang, M. Gohdo, K. Kan, T. Kondoh, K. Tanimura, Y. Yoshida
ISIR, Osaka, Japan
J. Urakawa
KEK, Ibaraki, Japan

The first prototype of RF gun based relativistic-energy electron microscopy has been constructed at Osaka University to study ultrafast structural dynamic processes in matter. The RF gun driven by a femtosecond laser has generated a 100-fs-pulse MeV electron beam with emittance of 0.1 mm-mrad and energy spread of 10^-4. Both the electron diffraction and image measurements have been succeeded in the prototype using the femtosecond electron beam. In the diffraction measurement, an excellent quality of diffraction pattern was acquired with electron number of 10⁶. The single-shot measurement is available in the prototype. In the image measurement, the TEM image was acquired with a total electron number of 10⁸. The magnification was 3,000 times. In the next step, we will reduce further the emittance to increase the beam brightness on the sample, and then improve the spatial resolution to <10 nm.

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2014-WEPRO103

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)