Author: Schäfers, F.
Paper Title Page
WEPME034 Soft X-ray Reflectivity and Photoelectron Yield of Technical Materials: Experimental Input for Instability Simulations in High Intensity Accelerators 2335
 
  • R. Cimino
    INFN/LNF, Frascati (Roma), Italy
  • R. Cimino
    CERN, Geneva, Switzerland
  • F. Schäfers
    HZB, Berlin, Germany
 
  High luminosity particle accelerators can suffer from serious performance drop or limitations due to interaction of the synchrotron radiation produced by the accelerator itself with the accelerator walls. Such interaction may produce a number of photoelectrons, that can either seed electron cloud related instabilities and/or interact anyway with the beam itself, potentially causing its deterioration. To correctly take these effects into account simulation codes depends on the realistic knowledge of Reflectivity and Photoelectron Yield of technical material. In this work we present relevant experimental data for some of the mostly used technical surfaces in accelerators.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2014-WEPME034  
Export • reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)