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RIS citation export for THPRO092: Stochastic Noise Effects in High Current PIC Simulation

TY - CONF
AU - Hofmann, I.
AU - Boine-Frankenheim, O.
ED - Petit-Jean-Genaz, Christine
ED - Arduini, Gianluigi
ED - Michel, Peter
ED - Schaa, Volker RW
TI - Stochastic Noise Effects in High Current PIC Simulation
J2 - Proc. of IPAC2014, Dresden, Germany, June 15-20, 2014
C1 - Dresden, Germany
T2 - International Particle Accelerator Conference
T3 - 5
LA - english
AB - The numerical noise inherent to particle-in-cell simulation of 3D high intensity bunched beams is studied with the TRACEWIN code and compared with the analytical model by Struckmeier (1994). The latter assumes the six-dimensional rms emittance or rms entropy growth can be related to Markov type stochastic processes due to temperature anisotropy and the artificial "collisions" caused by using macro-particles and calculating the space charge effect. Our entropy growth confirms the dependency on bunch temperature anisotropy as predicted by Struckmeier. However, we also find noise generation by the non-Liouvillean effect of the Poisson solver grid, which exists in periodic focusing systems even when local temperature anisotropy is absent - contrary to predictions by Struckmeier's model.
PB - JACoW
CP - Geneva, Switzerland
SP - 3101
EP - 3103
KW - emittance
KW - space-charge
KW - lattice
KW - simulation
KW - solenoid
DA - 2014/07
PY - 2014
SN - 978-3-95450-132-8
DO - 10.18429/JACoW-IPAC2014-THPRO092
UR - http://jacow.org/ipac2014/papers/thpro092.pdf
ER -