Title |
Effect of the Electron Beam Emittance on the ILSF Radiation of Sources and Beamline Design |
Authors |
- A. Gholampour, S. Amiri, H. Ghasempresenter, H. Khosroabadi, J. Rahighi
ILSF, Tehran, Iran
- H. Ghasempresenter, M. Lamehi Rashti, J. Rahighi
IPM, Tehran, Iran
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Abstract |
At the Iranian Light Source Facility (ILSF), two different storage ring options are being studied. The designs differ in emittance. In the first option the calculated emittance is 3.278 nm-rad whereas for the second option emittance is 0.937 nm-rad. In this paper the electron beam emittance effects on the source radiation properties from bending magnet, wiggler and undulator, X-ray optics and the beamline design are carefully studied. The present calculations demonstrate that in the case of 0.937 nm-rad brilliance of undulator is increased by a factor of about 5. For bending magnet, flux is reduced almost 1 order of magnitude for hard x-ray regime. Because of smaller size of the source for undulator at the case of 0.937 nm-rad, we can achieve to a smaller spot size and higher resolution with easier focusing systems and usual kind of monochromator than the emittance of 3.278 nm-rad and for the bending magnet hard x-ray beamline, size of the mirrors reduced 30% in the 0.937 nm-rad emittance case, so its result is shorter mirror, low cost and perhaps more challengeable heat load.
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Paper |
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Conference |
IPAC2014, Dresden, Germany |
Series |
International Particle Accelerator Conference (5th) |
Proceedings |
Link to full IPAC2014 Proccedings |
Session |
Poster Session, Ronaldo Area |
Date |
18-Jun-14 16:00–18:00 |
Main Classification |
02 Synchrotron Light Sources and FELs |
Sub Classification |
T26 Photon Beam Lines and Components |
Keywords |
emittance, photon, undulator, brilliance, electron |
Publisher |
JACoW Publishing, Geneva, Switzerland |
Editors |
Christine Petit-Jean-Genaz (CERN, Geneva, Switzerland); Gianluigi Arduini (CERN, Geneva, Switzerland); Peter Michel (HZDR, Dresden, Germany); Volker RW Schaa (GSI, Darmstadt, Germany) |
ISBN |
978-3-95450-132-8 |
Published |
July 2014 |
Copyright |
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