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https://doi.org/10.18429/JACoW-IPAC2014-WEPRO057
Title Effect of the Electron Beam Emittance on the ILSF Radiation of Sources and Beamline Design
Authors
  • A. Gholampour, S. Amiri, H. Ghasempresenter, H. Khosroabadi, J. Rahighi
    ILSF, Tehran, Iran
  • H. Ghasempresenter, M. Lamehi Rashti, J. Rahighi
    IPM, Tehran, Iran
Abstract At the Iranian Light Source Facility (ILSF), two different storage ring options are being studied. The designs differ in emittance. In the first option the calculated emittance is 3.278 nm-rad whereas for the second option emittance is 0.937 nm-rad. In this paper the electron beam emittance effects on the source radiation properties from bending magnet, wiggler and undulator, X-ray optics and the beamline design are carefully studied. The present calculations demonstrate that in the case of 0.937 nm-rad brilliance of undulator is increased by a factor of about 5. For bending magnet, flux is reduced almost 1 order of magnitude for hard x-ray regime. Because of smaller size of the source for undulator at the case of 0.937 nm-rad, we can achieve to a smaller spot size and higher resolution with easier focusing systems and usual kind of monochromator than the emittance of 3.278 nm-rad and for the bending magnet hard x-ray beamline, size of the mirrors reduced 30% in the 0.937 nm-rad emittance case, so its result is shorter mirror, low cost and perhaps more challengeable heat load.
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Conference IPAC2014, Dresden, Germany
Series International Particle Accelerator Conference (5th)
Proceedings Link to full IPAC2014 Proccedings
Session Poster Session, Ronaldo Area
Date 18-Jun-14   16:00–18:00
Main Classification 02 Synchrotron Light Sources and FELs
Sub Classification T26 Photon Beam Lines and Components
Keywords emittance, photon, undulator, brilliance, electron
Publisher JACoW Publishing, Geneva, Switzerland
Editors Christine Petit-Jean-Genaz (CERN, Geneva, Switzerland); Gianluigi Arduini (CERN, Geneva, Switzerland); Peter Michel (HZDR, Dresden, Germany); Volker RW Schaa (GSI, Darmstadt, Germany)
ISBN 978-3-95450-132-8
Published July 2014
Copyright
Copyright © 2014 by JACoW, Geneva, Switzerland     CC-BY Creative Commons License
cc Creative Commons Attribution 3.0