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WEPEA067 |
Beam Optics Measurements through Turn by turn Beam Position Data in the SLS |
2663 |
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- P. Zisopoulos, Y. Papaphilippou
CERN, Geneva, Switzerland
- A. Streun
PSI, Villigen PSI, Switzerland
- V.G. Ziemann
Uppsala University, Uppsala, Sweden
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Refined Fourier analysis of turn-by-turn (TBT) transverse position data measurements can be used for determining several beam properties of a ring, such as transverse tunes, optics functions, phases, chromatic properties and coupling. In particular, the Numerical Analysis of Fundamental Frequencies (NAFF) algorithm is used to analyze TBT data from the Swiss Light Source (SLS) storage ring in order to estimate on and off-momentum beam characteristics. Of particular interest is the potential of using the full position information within one turn in order to measure beam optics properties.
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