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- I. Pinayev, S.A. Belomestnykh, I. Ben-Zvi, K.A. Brown, J.C. Brutus, L. DeSanto, A. Elizarov, C. Folz, D.M. Gassner, Y. Hao, R.L. Hulsart, Y.C. Jing, D. Kayran, R.F. Lambiase, V. Litvinenko, G.J. Mahler, M. Mapes, W. Meng, R.J. Michnoff, T.A. Miller, M.G. Minty, P. Orfin, A. Pendzick, F. Randazzo, T. Rao, T. Roser, J. Sandberg, B. Sheehy, J. Skaritka, K.S. Smith, L. Snydstrup, R. Than, R.J. Todd, J.E. Tuozzolo, G. Wang, D. Weiss, M. Wilinski, W. Xu, A. Zaltsman
BNL, Upton, Long Island, New York, USA
- G.I. Bell, J.R. Cary, K. Paul, B.T. Schwartz, S.D. Webb
Tech-X, Boulder, Colorado, USA
- C.H. Boulware, T.L. Grimm, R. Jecks, N. Miller
Niowave, Inc., Lansing, Michigan, USA
- M.A. Kholopov, P. Vobly
BINP SB RAS, Novosibirsk, Russia
- M. Poelker
JLAB, Newport News, Virginia, USA
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- S.V. Sinyatkin, G.N. Baranov, A.M. Batrakov, P.N. Burdin, D.B. Burenkov, S.M. Gurov, V.A. Kiselev, V.V. Kobets, E.B. Levichev, I.N. Okunev, A. Polyansky, Yu.A. Pupkov, L.E. Serdakov, P. Vobly
BINP SB RAS, Novosibirsk, Russia
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