Author: Tan, J.H.
Paper Title Page
WEPFI039 New X-band Deflecting Cavity Design for Ultra-short Bunch Length Measure of FEL at SINAP 2788
 
  • J.H. Tan, W. Fang, Q. Gu, Z.T. Zhao
    SINAP, Shanghai, People's Republic of China
 
  For the development of Free Electron Lasers (FEL) at SINAP, ultra-short bunch is the crucial requirement for excellent lasing performance. It’s big challenge for deflecting cavity to measure the length of ultra-short bunch, and higher deflecting gradient is required for higher measurement resolution. X-band travelling wave deflecting structure has features of higher deflecting voltage and compact structure, which is good performance at ultra-short bunch length measuring. In this paper, a new X-band deflecting structure was designed, operated at HEM11- 2π/3 mode. For suppressing the polarization of deflection plane of the HEM11 mode, two symmetrical caves are added on the cavity wall to separate two polarized modes. More details of design and simulation results are presented in this paper.