IPAC2013 - List of Authors (Strohman, C.R.)

Paper	Title	Page
MOPWA073	A Turn-by-turn Beam Profile Monitor using Visible Synchrotron Radiation at CESR-TA	849
	S. Wang, D. L. Rubin, C.R. Strohman CLASSE, Ithaca, New York, USA R.F. Campbell, R. Holtzapple CalPoly, San Luis Obispo, California, USA
	Funding: Work supported by the National Science Foundation and Department of Energy under contract numbers PHY-0734867, PHY-1002467, DMR-0936384, and DE-FC02-08ER41538, DE-SC0006505 A fast beam profile monitor using visible synchrotron radiation (SR) has been constructed and installed in Cornell Electron Storage Ring. This monitor utilizes fast readout electronics based on the Hamamatsu H7260K multi-anode photomultiplier, which has a 32-channel linear array with 1mm channel pitch and sub-nanosecond rise time. In a low emittance lattice at 2 GeV, a double-slit interferometer is employed to measure the horizontal beam size. After careful calibration of the interference pattern, the horizontal beam size within a range of 100 to 500 microns can be measured with a precision of ±5 microns. Due to finite array size, the small vertical beam size is measured by imaging the pi-polarized component of the SR. The fast beam profile monitor is capable of measuring bunch-by-bunch turn-by-turn transverse beam sizes, which eliminates beam jitter inherent when imaging the average beam size with a CCD camera. Details of hardware and software controls are also discussed.

Paper

Title

Page

A Turn-by-turn Beam Profile Monitor using Visible Synchrotron Radiation at CESR-TA

849

S. Wang, D. L. Rubin, C.R. Strohman
CLASSE, Ithaca, New York, USA
R.F. Campbell, R. Holtzapple
CalPoly, San Luis Obispo, California, USA

Funding: Work supported by the National Science Foundation and Department of Energy under contract numbers PHY-0734867, PHY-1002467, DMR-0936384, and DE-FC02-08ER41538, DE-SC0006505
A fast beam profile monitor using visible synchrotron radiation (SR) has been constructed and installed in Cornell Electron Storage Ring. This monitor utilizes fast readout electronics based on the Hamamatsu H7260K multi-anode photomultiplier, which has a 32-channel linear array with 1mm channel pitch and sub-nanosecond rise time. In a low emittance lattice at 2 GeV, a double-slit interferometer is employed to measure the horizontal beam size. After careful calibration of the interference pattern, the horizontal beam size within a range of 100 to 500 microns can be measured with a precision of ±5 microns. Due to finite array size, the small vertical beam size is measured by imaging the pi-polarized component of the SR. The fast beam profile monitor is capable of measuring bunch-by-bunch turn-by-turn transverse beam sizes, which eliminates beam jitter inherent when imaging the average beam size with a CCD camera. Details of hardware and software controls are also discussed.