IPAC2013 - List of Authors (Ma, Q.)

Paper	Title	Page
WEPWO018	Status of the IHEP 1.3 GHz Superconducting RF Program for the ILC	2355
	J. Gao, Y.L. Chi, J.P. Dai, R. Ge, T.M. Huang, S. Jin, C. H. Li, S.P. Li, Z.Q. Li, H.Y. Lin, Y. Liu, Z.C. Liu, Q. Ma, Z.H. Mi, W.M. Pan, Y. Sun, J.Y. Zhai, T.X. Zhao, H.J. Zheng IHEP, Beijing, People's Republic of China
	The 1.3 GHz superconducting radio-frequency (SRF) technology is one of the key technologies for the ILC. IHEP is building an SRF Accelerating Unit, named the IHEP ILC Test Cryomodule (IHEP ILC-TC1), for the ILC SRF system integration study, high power horizontal test and possible beam test in the future. In this paper, we report the components test results and the assembly preparation of this cryomodule. Processing and vertical test of the large grain low-loss shape 9-cell cavity is done. Performance of the in-house made high power input coupler and tuner at room temperature reaches the ILC specification.

WEPWO025	Preliminary Design of 325 MHz Half-Wave Resonator	2369
	X.Y. Zhang, X. Chen, Z.Q. Li, Q. Ma, W.M. Pan, Y. Sun, G.W. Wang, Q.Y. Wang, B. Xu, G.Y. Zhao IHEP, Beijing, People's Republic of China
	Funding: This work is supported by the "Strategic Priority Research Program" of CAS. The Half-Wave Resonator (HWR) has been widely used in proton and heavy ion accelerators, for it has particular advantages of accelerating low energy charged particles. Preliminary design of a 325 MHz β=0.12 superconducting HWR cavity has been proposed at Institute of High Energy Physics (IHEP). The basic geometric parameters choices of the cavity are based upon theoretical model and numerical calculation, and then the RF performances are optimized by extensive electromagnetic simulations. In this paper, the detailed mechanical analysis, frequency control, and the considerations for fabrication of the 325 MHz HWR cavity are also presented.

THPWO041	The development of a high power input coupler for China ADS injector I RFQ	3857
	T.M. Huang, X. Chen, R. Guo, H.Y. Lin, Q. Ma, F. Meng, H.F. Ouyang, W.M. Pan, X.H. Peng, Z. Zhang, G.Y. Zhao IHEP, Beijing, People's Republic of China
	A 325 MHz RFQ is designed to accelerate a beam current of 15 mA in CW mode with injection energy of 35 keV and output energy of 3.2 MeV for China Accelerator Driven sub-critical System (ADS) injector I. Total RF power of 320 kW has to be delivered into the RFQ cavity. For reliable operation, four input couplers are adopted to share the driven power. A coaxial loop type input coupler is developed. The coupler features a Tristan type RF window, a doorknob to realize the transition from a half-height WR2300 waveguide to a coaxial line and a coaxial line with a coupling antenna loop. Two prototypes of the window and inner conductor assemblies have been fabricated and received high power test. The prototypes were tested up to 100 kW CW RF power in traveling wave mode. This paper will describe the design, fabrication and high power test of the coupler in details.

THPWA027	Evaluation of Zero-failure Data in Transient Ionizing Radiation Based on Ordering Method in the Sample Space	3681
	X.Y. Bai, X.M. Jin, R.B. Li, Y. Liu, Q. Ma, Ch. Qi NINT, Xi'an, People's Republic of China
	The conventional method for the evaluation of data in lot acceptance testing (LAT) of transient ionizing radiation is non-parametric method. But the evaluation results are very conservative. After the discovery of data in transient ionizing radiation belonging to one universal data model “case 1 interval censored data”, ordering method in the sample space was introduced and applied to evaluate zero-failure data and was compared with non-parametric method both theoretically and via a practical LAT on QG-Ⅰ. Through the comparisons, it is concluded that ordering method can expand the scope of dose rate corresponding to the same lower confidence limit. It improves data utilization and this improvement could have practical significance in LAT. It can reduce requirements for the radiation source and can also reduce the number of trials.

THPWA028	Analysis of Uncertainty of Dose Rate Measurement on the Accelerator “QiangGuang-I”	3684
	R.B. Li, X.Y. Bai, X.M. Jin, Q. Ma, C. Qi, G.Z. Wang NINT, Xi'an, People's Republic of China
	“QiangGuang-I”, working on short pulse state, can be used to research the transient radiation effects on electronic devices. The measurement of dose rate is significant for assessing devices’ radiation-resistant ability. This paper comprehensively analyzes the originations of uncertainty on dose rate’s measurement, such as thermoluminescent dosemeter’s linearity degree and response to X-rays energy spectrum, testing instruments’ resolution, waveforms’ transmission distortion , and positional error; figures out the extended uncertainty. The result shows that the expanded uncertainty of dose rate’s measurement is less than 20%, which is satisfactory for researching on devices’ transient radiation effects, and proves that the method used to measure dose rate is reasonable.

THPWA029	Transient Ionizing Radiation Effect of Bipolar Operational Amplifiers to Pulsed X-rays	3687
	X.M. Jin Xiaoming Jin, People's Republic of China X.Y. Bai, R.B. Li, D.S. Lin, Q. Ma, C. Qi, G.Z. Wang, S.C. Yang NINT, Xi'an, People's Republic of China
	Abstract – The pulsed ionizing radiation effect of monolithic operational amplifiers is investigated using a flash X-ray facility. The experimental results show that the pulsed ionizing radiation produces voltage surges in the devices and the output voltage recovers linearly after transient disturbance which includes a negative peak and a positive peak. The recovery time depends on the amplitude of the positive peak and the inherent slew rate of the devices. The degradation of transient disturbance amplitude and the recovery time versus ionizing dose rate of pulsed X-rays is researched. The relationship of circuit effects to physical mechanisms is investigated in detail. The photocurrent induced by transient ionizing radiation in the PN junctions in integrated circuits is responsible for the electrical degradation. Keywords – Transient ionizing Radiation effect, Transient disturbance, Photocurrent, integrated circuits

Paper

Title

Page

Status of the IHEP 1.3 GHz Superconducting RF Program for the ILC

2355

J. Gao, Y.L. Chi, J.P. Dai, R. Ge, T.M. Huang, S. Jin, C. H. Li, S.P. Li, Z.Q. Li, H.Y. Lin, Y. Liu, Z.C. Liu, Q. Ma, Z.H. Mi, W.M. Pan, Y. Sun, J.Y. Zhai, T.X. Zhao, H.J. Zheng
IHEP, Beijing, People's Republic of China

The 1.3 GHz superconducting radio-frequency (SRF) technology is one of the key technologies for the ILC. IHEP is building an SRF Accelerating Unit, named the IHEP ILC Test Cryomodule (IHEP ILC-TC1), for the ILC SRF system integration study, high power horizontal test and possible beam test in the future. In this paper, we report the components test results and the assembly preparation of this cryomodule. Processing and vertical test of the large grain low-loss shape 9-cell cavity is done. Performance of the in-house made high power input coupler and tuner at room temperature reaches the ILC specification.

WEPWO025

Preliminary Design of 325 MHz Half-Wave Resonator

2369

X.Y. Zhang, X. Chen, Z.Q. Li, Q. Ma, W.M. Pan, Y. Sun, G.W. Wang, Q.Y. Wang, B. Xu, G.Y. Zhao
IHEP, Beijing, People's Republic of China

Funding: This work is supported by the "Strategic Priority Research Program" of CAS.
The Half-Wave Resonator (HWR) has been widely used in proton and heavy ion accelerators, for it has particular advantages of accelerating low energy charged particles. Preliminary design of a 325 MHz β=0.12 superconducting HWR cavity has been proposed at Institute of High Energy Physics (IHEP). The basic geometric parameters choices of the cavity are based upon theoretical model and numerical calculation, and then the RF performances are optimized by extensive electromagnetic simulations. In this paper, the detailed mechanical analysis, frequency control, and the considerations for fabrication of the 325 MHz HWR cavity are also presented.

THPWO041

The development of a high power input coupler for China ADS injector I RFQ

3857

T.M. Huang, X. Chen, R. Guo, H.Y. Lin, Q. Ma, F. Meng, H.F. Ouyang, W.M. Pan, X.H. Peng, Z. Zhang, G.Y. Zhao
IHEP, Beijing, People's Republic of China

A 325 MHz RFQ is designed to accelerate a beam current of 15 mA in CW mode with injection energy of 35 keV and output energy of 3.2 MeV for China Accelerator Driven sub-critical System (ADS) injector I. Total RF power of 320 kW has to be delivered into the RFQ cavity. For reliable operation, four input couplers are adopted to share the driven power. A coaxial loop type input coupler is developed. The coupler features a Tristan type RF window, a doorknob to realize the transition from a half-height WR2300 waveguide to a coaxial line and a coaxial line with a coupling antenna loop. Two prototypes of the window and inner conductor assemblies have been fabricated and received high power test. The prototypes were tested up to 100 kW CW RF power in traveling wave mode. This paper will describe the design, fabrication and high power test of the coupler in details.

THPWA027

Evaluation of Zero-failure Data in Transient Ionizing Radiation Based on Ordering Method in the Sample Space

3681

X.Y. Bai, X.M. Jin, R.B. Li, Y. Liu, Q. Ma, Ch. Qi
NINT, Xi'an, People's Republic of China

The conventional method for the evaluation of data in lot acceptance testing (LAT) of transient ionizing radiation is non-parametric method. But the evaluation results are very conservative. After the discovery of data in transient ionizing radiation belonging to one universal data model “case 1 interval censored data”, ordering method in the sample space was introduced and applied to evaluate zero-failure data and was compared with non-parametric method both theoretically and via a practical LAT on QG-Ⅰ. Through the comparisons, it is concluded that ordering method can expand the scope of dose rate corresponding to the same lower confidence limit. It improves data utilization and this improvement could have practical significance in LAT. It can reduce requirements for the radiation source and can also reduce the number of trials.

THPWA028

Analysis of Uncertainty of Dose Rate Measurement on the Accelerator “QiangGuang-I”

3684

R.B. Li, X.Y. Bai, X.M. Jin, Q. Ma, C. Qi, G.Z. Wang
NINT, Xi'an, People's Republic of China

“QiangGuang-I”, working on short pulse state, can be used to research the transient radiation effects on electronic devices. The measurement of dose rate is significant for assessing devices’ radiation-resistant ability. This paper comprehensively analyzes the originations of uncertainty on dose rate’s measurement, such as thermoluminescent dosemeter’s linearity degree and response to X-rays energy spectrum, testing instruments’ resolution, waveforms’ transmission distortion , and positional error; figures out the extended uncertainty. The result shows that the expanded uncertainty of dose rate’s measurement is less than 20%, which is satisfactory for researching on devices’ transient radiation effects, and proves that the method used to measure dose rate is reasonable.

THPWA029

Transient Ionizing Radiation Effect of Bipolar Operational Amplifiers to Pulsed X-rays

3687

X.M. Jin
Xiaoming Jin, People's Republic of China
X.Y. Bai, R.B. Li, D.S. Lin, Q. Ma, C. Qi, G.Z. Wang, S.C. Yang
NINT, Xi'an, People's Republic of China

Abstract – The pulsed ionizing radiation effect of monolithic operational amplifiers is investigated using a flash X-ray facility. The experimental results show that the pulsed ionizing radiation produces voltage surges in the devices and the output voltage recovers linearly after transient disturbance which includes a negative peak and a positive peak. The recovery time depends on the amplitude of the positive peak and the inherent slew rate of the devices. The degradation of transient disturbance amplitude and the recovery time versus ionizing dose rate of pulsed X-rays is researched. The relationship of circuit effects to physical mechanisms is investigated in detail. The photocurrent induced by transient ionizing radiation in the PN junctions in integrated circuits is responsible for the electrical degradation. Keywords – Transient ionizing Radiation effect, Transient disturbance, Photocurrent, integrated circuits