Author: Ma, Q.
Paper Title Page
WEPWO018 Status of the IHEP 1.3 GHz Superconducting RF Program for the ILC 2355
  • J. Gao, Y.L. Chi, J.P. Dai, R. Ge, T.M. Huang, S. Jin, C. H. Li, S.P. Li, Z.Q. Li, H.Y. Lin, Y. Liu, Z.C. Liu, Q. Ma, Z.H. Mi, W.M. Pan, Y. Sun, J.Y. Zhai, T.X. Zhao, H.J. Zheng
    IHEP, Beijing, People's Republic of China
  The 1.3 GHz superconducting radio-frequency (SRF) technology is one of the key technologies for the ILC. IHEP is building an SRF Accelerating Unit, named the IHEP ILC Test Cryomodule (IHEP ILC-TC1), for the ILC SRF system integration study, high power horizontal test and possible beam test in the future. In this paper, we report the components test results and the assembly preparation of this cryomodule. Processing and vertical test of the large grain low-loss shape 9-cell cavity is done. Performance of the in-house made high power input coupler and tuner at room temperature reaches the ILC specification.  
WEPWO025 Preliminary Design of 325 MHz Half-Wave Resonator 2369
  • X.Y. Zhang, X. Chen, Z.Q. Li, Q. Ma, W.M. Pan, Y. Sun, G.W. Wang, Q.Y. Wang, B. Xu, G.Y. Zhao
    IHEP, Beijing, People's Republic of China
  Funding: This work is supported by the "Strategic Priority Research Program" of CAS.
The Half-Wave Resonator (HWR) has been widely used in proton and heavy ion accelerators, for it has particular advantages of accelerating low energy charged particles. Preliminary design of a 325 MHz β=0.12 superconducting HWR cavity has been proposed at Institute of High Energy Physics (IHEP). The basic geometric parameters choices of the cavity are based upon theoretical model and numerical calculation, and then the RF performances are optimized by extensive electromagnetic simulations. In this paper, the detailed mechanical analysis, frequency control, and the considerations for fabrication of the 325 MHz HWR cavity are also presented.
THPWO041 The development of a high power input coupler for China ADS injector I RFQ 3857
  • T.M. Huang, X. Chen, R. Guo, H.Y. Lin, Q. Ma, F. Meng, H.F. Ouyang, W.M. Pan, X.H. Peng, Z. Zhang, G.Y. Zhao
    IHEP, Beijing, People's Republic of China
  A 325 MHz RFQ is designed to accelerate a beam current of 15 mA in CW mode with injection energy of 35 keV and output energy of 3.2 MeV for China Accelerator Driven sub-critical System (ADS) injector I. Total RF power of 320 kW has to be delivered into the RFQ cavity. For reliable operation, four input couplers are adopted to share the driven power. A coaxial loop type input coupler is developed. The coupler features a Tristan type RF window, a doorknob to realize the transition from a half-height WR2300 waveguide to a coaxial line and a coaxial line with a coupling antenna loop. Two prototypes of the window and inner conductor assemblies have been fabricated and received high power test. The prototypes were tested up to 100 kW CW RF power in traveling wave mode. This paper will describe the design, fabrication and high power test of the coupler in details.  
THPWA027 Evaluation of Zero-failure Data in Transient Ionizing Radiation Based on Ordering Method in the Sample Space 3681
  • X.Y. Bai, X.M. Jin, R.B. Li, Y. Liu, Q. Ma, Ch. Qi
    NINT, Xi'an, People's Republic of China
  The conventional method for the evaluation of data in lot acceptance testing (LAT) of transient ionizing radiation is non-parametric method. But the evaluation results are very conservative. After the discovery of data in transient ionizing radiation belonging to one universal data model “case 1 interval censored data”, ordering method in the sample space was introduced and applied to evaluate zero-failure data and was compared with non-parametric method both theoretically and via a practical LAT on QG-Ⅰ. Through the comparisons, it is concluded that ordering method can expand the scope of dose rate corresponding to the same lower confidence limit. It improves data utilization and this improvement could have practical significance in LAT. It can reduce requirements for the radiation source and can also reduce the number of trials.  
THPWA028 Analysis of Uncertainty of Dose Rate Measurement on the Accelerator “QiangGuang-I” 3684
  • R.B. Li, X.Y. Bai, X.M. Jin, Q. Ma, C. Qi, G.Z. Wang
    NINT, Xi'an, People's Republic of China
  “QiangGuang-I”, working on short pulse state, can be used to research the transient radiation effects on electronic devices. The measurement of dose rate is significant for assessing devices’ radiation-resistant ability. This paper comprehensively analyzes the originations of uncertainty on dose rate’s measurement, such as thermoluminescent dosemeter’s linearity degree and response to X-rays energy spectrum, testing instruments’ resolution, waveforms’ transmission distortion , and positional error; figures out the extended uncertainty. The result shows that the expanded uncertainty of dose rate’s measurement is less than 20%, which is satisfactory for researching on devices’ transient radiation effects, and proves that the method used to measure dose rate is reasonable.  
THPWA029 Transient Ionizing Radiation Effect of Bipolar Operational Amplifiers to Pulsed X-rays 3687
  • X.M. Jin
    Xiaoming Jin, People's Republic of China
  • X.Y. Bai, R.B. Li, D.S. Lin, Q. Ma, C. Qi, G.Z. Wang, S.C. Yang
    NINT, Xi'an, People's Republic of China
  Abstract – The pulsed ionizing radiation effect of monolithic operational amplifiers is investigated using a flash X-ray facility. The experimental results show that the pulsed ionizing radiation produces voltage surges in the devices and the output voltage recovers linearly after transient disturbance which includes a negative peak and a positive peak. The recovery time depends on the amplitude of the positive peak and the inherent slew rate of the devices. The degradation of transient disturbance amplitude and the recovery time versus ionizing dose rate of pulsed X-rays is researched. The relationship of circuit effects to physical mechanisms is investigated in detail. The photocurrent induced by transient ionizing radiation in the PN junctions in integrated circuits is responsible for the electrical degradation. Keywords – Transient ionizing Radiation effect, Transient disturbance, Photocurrent, integrated circuits