Author: Jin, X.M.
Paper Title Page
THPWA027 Evaluation of Zero-failure Data in Transient Ionizing Radiation Based on Ordering Method in the Sample Space 3681
  • X.Y. Bai, X.M. Jin, R.B. Li, Y. Liu, Q. Ma, Ch. Qi
    NINT, Xi'an, People's Republic of China
  The conventional method for the evaluation of data in lot acceptance testing (LAT) of transient ionizing radiation is non-parametric method. But the evaluation results are very conservative. After the discovery of data in transient ionizing radiation belonging to one universal data model “case 1 interval censored data”, ordering method in the sample space was introduced and applied to evaluate zero-failure data and was compared with non-parametric method both theoretically and via a practical LAT on QG-Ⅰ. Through the comparisons, it is concluded that ordering method can expand the scope of dose rate corresponding to the same lower confidence limit. It improves data utilization and this improvement could have practical significance in LAT. It can reduce requirements for the radiation source and can also reduce the number of trials.  
THPWA028 Analysis of Uncertainty of Dose Rate Measurement on the Accelerator “QiangGuang-I” 3684
  • R.B. Li, X.Y. Bai, X.M. Jin, Q. Ma, C. Qi, G.Z. Wang
    NINT, Xi'an, People's Republic of China
  “QiangGuang-I”, working on short pulse state, can be used to research the transient radiation effects on electronic devices. The measurement of dose rate is significant for assessing devices’ radiation-resistant ability. This paper comprehensively analyzes the originations of uncertainty on dose rate’s measurement, such as thermoluminescent dosemeter’s linearity degree and response to X-rays energy spectrum, testing instruments’ resolution, waveforms’ transmission distortion , and positional error; figures out the extended uncertainty. The result shows that the expanded uncertainty of dose rate’s measurement is less than 20%, which is satisfactory for researching on devices’ transient radiation effects, and proves that the method used to measure dose rate is reasonable.  
THPWA029 Transient Ionizing Radiation Effect of Bipolar Operational Amplifiers to Pulsed X-rays 3687
  • X.M. Jin
    Xiaoming Jin, People's Republic of China
  • X.Y. Bai, R.B. Li, D.S. Lin, Q. Ma, C. Qi, G.Z. Wang, S.C. Yang
    NINT, Xi'an, People's Republic of China
  Abstract – The pulsed ionizing radiation effect of monolithic operational amplifiers is investigated using a flash X-ray facility. The experimental results show that the pulsed ionizing radiation produces voltage surges in the devices and the output voltage recovers linearly after transient disturbance which includes a negative peak and a positive peak. The recovery time depends on the amplitude of the positive peak and the inherent slew rate of the devices. The degradation of transient disturbance amplitude and the recovery time versus ionizing dose rate of pulsed X-rays is researched. The relationship of circuit effects to physical mechanisms is investigated in detail. The photocurrent induced by transient ionizing radiation in the PN junctions in integrated circuits is responsible for the electrical degradation. Keywords – Transient ionizing Radiation effect, Transient disturbance, Photocurrent, integrated circuits