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WEPWA021 |
X-ray Spectra Reconstruction with HOPG Crystal on TTX |
2174 |
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- Z. Zhang, Y.-C. Du, J.F. Hua, W.-H. Huang, C.-X. Tang, D. Wang, L.X. Yan
TUB, Beijing, People's Republic of China
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Thomson Scattering sources, as the new generation of bright X-ray sources, have great application potential in many respects. Traditional spectra measurement methods, applied to measured the spectra of Thomson Scattering source, are troublesome as the X-ray beam is too intense to cause pile up problems. In this article, we use the HOPG crystal to reconstruct the X-ray spectra of Tsinghua Thomson X-ray source (TTX) through Braggs law. This method can get reasonable results with single or several shots, with high energy resolution. We also compare the experiment results of this method with the reconstructed spectra by analyzing the attenuation data of the X-ray beam in silicon , and these two results agree well with each other.
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