Author: Corlett, J.N.
Paper Title Page
TUPME062 Simulation and Analysis of Microbunching Instability in a High Repetition rate FEL Beam Delivery System 1709
  • J. Qiang, J.N. Corlett, P. Emma, C.E. Mitchell, M. Venturini
    LBNL, Berkeley, California, USA
  Funding: Work supported by the Director of the Office of Science of the US Department of Energy under Contract no. DEAC02-05CH11231.
Microbunching instability in the accelerator beam delivery system of an FEL can significantly degrade the electron beam quality and limit performance of the X-ray radiation. In this paper, we present detailed numerical simulation and analytical analysis of the microbunching instability in a high repetition rate X-ray FEL beam delivery system that is being studied at Lawrence Berkeley National Laboratory. Our results suggest that by using a flexible accelerator design and a laser heater, the effects of microbunching instability can be suppressed without significantly sacrificing the final electron beam quality.
WEPWA068 Design Concepts for the NGLS Linac 2271
  • A. Ratti, J.M. Byrd, J.N. Corlett, L.R. Doolittle, P. Emma, J. Qiang, M. Venturini, R.P. Wells
    LBNL, Berkeley, California, USA
  • C. Adolphsen, C.D. Nantista
    SLAC, Menlo Park, California, USA
  • D. Arenius, S.V. Benson, D. Douglas, A. Hutton, G. Neil, W. Oren, G.P. Williams
    JLAB, Newport News, Virginia, USA
  • C.M. Ginsburg, R.D. Kephart, T.J. Peterson, A.I. Sukhanov
    Fermilab, Batavia, USA
  The Next Generation Light Source (NGLS) is a design concept for a multibeamline soft x-ray FEL array powered by a ~2.4 GeV CW superconducting linear accelerator, operating with a 1 MHz bunch repetition rate. This paper describes the concepts under development for a linac operating at 1.3 GHZ and based on minimal modifications to the design of ILC cryomodules in order to leverage the extensive R&D that resulted in the ILC design. Due to the different nature of the two applications, particular attention is given here to high loaded Q operation andμphonics control, as well as high reliability and expected up time.