IPAC2013 - List of Authors (Araki, S.)

Paper	Title	Page
MOPME018	BEAM OSCILLATION MONITOR FOR THE MULTI-BUNCH BEAM	506
	T. Naito, S. Araki, H. Hayano, K. Kubo, S. Kuroda, T. Okugi, N. Terunuma, J. Urakawa KEK, Ibaraki, Japan
	In order to observe the motion of bunch-by-bunch beam oscillation of multi-bunch in the storage ring, we developed two measurement tools. One is a signal process electronics circuit using fast analogue switches. The circuit picks up one of the selected bunch signal of the beam position monitor from the multi-bunch. The selected beam position signal can be processed as a single bunch beam. By changing the gate timing, arbitrary bunch signal can be selected. The other is a waveform memory using a high bandwidth oscilloscope. The long waveform memory of the oscilloscope has a capability to acquire the multi-turn waveform of the button electrode signals. The beam test of the circuit has been carried out at KEK-ATF damping ring in the cases of 2.8ns bunch spacing and 5.6ns bunch spacing, respectively. The detail of the hardware and the result of the beam test are reported.

Paper

Title

Page

BEAM OSCILLATION MONITOR FOR THE MULTI-BUNCH BEAM

506

T. Naito, S. Araki, H. Hayano, K. Kubo, S. Kuroda, T. Okugi, N. Terunuma, J. Urakawa
KEK, Ibaraki, Japan

In order to observe the motion of bunch-by-bunch beam oscillation of multi-bunch in the storage ring, we developed two measurement tools. One is a signal process electronics circuit using fast analogue switches. The circuit picks up one of the selected bunch signal of the beam position monitor from the multi-bunch. The selected beam position signal can be processed as a single bunch beam. By changing the gate timing, arbitrary bunch signal can be selected. The other is a waveform memory using a high bandwidth oscilloscope. The long waveform memory of the oscilloscope has a capability to acquire the multi-turn waveform of the button electrode signals. The beam test of the circuit has been carried out at KEK-ATF damping ring in the cases of 2.8ns bunch spacing and 5.6ns bunch spacing, respectively. The detail of the hardware and the result of the beam test are reported.