IPAC2012 - List of Authors (Schmidt, B.)

Paper

Title

Page

Inorganic Scintillators for Particle Beam Profile Diagnostics of Highly Brilliant and Highly Energetic Electron Beams

2119

G. Kube, C. Behrens, C. Gerth, B. Schmidt
DESY, Hamburg, Germany
W. Lauth
IKP, Mainz, Germany
M. Yan
Uni HH, Hamburg, Germany

Transverse beam profile diagnostics in electron linacs are widely based on optical transition radiation (OTR) as standard technique. The experience from modern linac based light sources shows that OTR diagnostics might fail because of coherence effects in the OTR emission process. As consequence, for the new 4th generation light sources as the European X-FEL, new reliable tools for transverse beam profile measurements are required. Scintillating screens are widely used for particle beam diagnostics, especially in transverse profile measurements at hadron machines and low energy electron machines where the intensity of OTR is rather low. Their usage may serve as an alternative way to overcome limitations in OTR based beam diagnostics imposed by the influence of coherent emission. However, there is only little information about scintillator properties for applications with high energetic electrons. Therefore, test experiments have been performed at the Mainz Microtron (MAMI) in order to study the screen applicability. The status of these experiments will be presented and the results will be discussed in view of scintillator material properties and observation geometry.

Slides WEOAA02 [1.648 MB]

Paper	Title	Page
WEOAA02	Inorganic Scintillators for Particle Beam Profile Diagnostics of Highly Brilliant and Highly Energetic Electron Beams	2119
	G. Kube, C. Behrens, C. Gerth, B. Schmidt DESY, Hamburg, Germany W. Lauth IKP, Mainz, Germany M. Yan Uni HH, Hamburg, Germany
	Transverse beam profile diagnostics in electron linacs are widely based on optical transition radiation (OTR) as standard technique. The experience from modern linac based light sources shows that OTR diagnostics might fail because of coherence effects in the OTR emission process. As consequence, for the new 4th generation light sources as the European X-FEL, new reliable tools for transverse beam profile measurements are required. Scintillating screens are widely used for particle beam diagnostics, especially in transverse profile measurements at hadron machines and low energy electron machines where the intensity of OTR is rather low. Their usage may serve as an alternative way to overcome limitations in OTR based beam diagnostics imposed by the influence of coherent emission. However, there is only little information about scintillator properties for applications with high energetic electrons. Therefore, test experiments have been performed at the Mainz Microtron (MAMI) in order to study the screen applicability. The status of these experiments will be presented and the results will be discussed in view of scintillator material properties and observation geometry.
	Slides WEOAA02 [1.648 MB]