Author: Olsen, R.H.
Paper Title Page
WEPPD084 The E-Lens Test Bench for Rhic Beam-Beam Compensation 2720
 
  • X. Gu, Z. Altinbas, J.N. Aronson, E.N. Beebe, W. Fischer, D.M. Gassner, K. Hamdi, J. Hock, L.T. Hoff, P. Kankiya, R.F. Lambiase, Y. Luo, M. Mapes, J.-L. Mi, T.A. Miller, C. Montag, S. Nemesure, M. Okamura, R.H. Olsen, A.I. Pikin, D. Raparia, P.J. Rosas, J. Sandberg, Y. Tan, C. Theisen, P. Thieberger, J.E. Tuozzolo, W. Zhang
    BNL, Upton, Long Island, New York, USA
 
  Funding: Work supported by Brookhaven Science Associates, LLC under Contract No. DE-AC02-98CH10886 with the U.S. Department of Energy.
To compensate for the beam-beam effects from the proton-proton interactions at IP6 and IP8 in the Relativistic Heavy Ion Collider (RHIC), we are fabricating two electron lenses that we plan to install at RHIC IR10. Before installing the e-lenses, we are setting-up the e-lens test bench to test the electron gun, collector, GS1 coil, modulator, partial control system, some instrumentation, and the application software. Some e-lens power supplies, the electronics for current measurement will also be qualified on test bench. The test bench also was designed for measuring the properties of the cathode and the profile of the beam. In this paper, we introduce the layout and elements of the e-lens test bench; and we discuss its present status towards the end of this paper.