Author: Kirby, R.E.
Paper Title Page
MOPPC019 Secondary Electron Yield Measurements of Fermilab’s Main Injector Vacuum Vessel 166
  • D.J. Scott, D. Capista, K.L. Duel, R.M. Zwaska
    Fermilab, Batavia, USA
  • S. Greenwald, W. Hartung, Y. Li, T.P. Moore, M.A. Palmer
    CLASSE, Ithaca, New York, USA
  • R.E. Kirby, M.T.F. Pivi, L. Wang
    SLAC, Menlo Park, California, USA
  We discuss the progress made on a new installation in Fermilab’s Main Injector that will help investigate the electron cloud phenomenon by making direct measurements of the secondary electron yield (SEY) of samples irradiated in the accelerator. In the Project X upgrade the Main Injector will have its beam intensity increased by a factor of three compared to current operations. This may result in the beam being subject to instabilities from the electron cloud. Measured SEY values can be used to further constrain simulations and aid our extrapolation to Project X intensities. The SEY test-stand, developed in conjunction with Cornell and SLAC, is capable of measuring the SEY from samples using an incident electron beam when the samples are biased at different voltages. We present the design and manufacture of the test-stand and the results of initial laboratory tests on samples prior to installation.