IPAC2012 - List of Authors (Kirby, R.E.)

Paper	Title	Page
MOPPC019	Secondary Electron Yield Measurements of Fermilab’s Main Injector Vacuum Vessel	166
	D.J. Scott, D. Capista, K.L. Duel, R.M. Zwaska Fermilab, Batavia, USA S. Greenwald, W. Hartung, Y. Li, T.P. Moore, M.A. Palmer CLASSE, Ithaca, New York, USA R.E. Kirby, M.T.F. Pivi, L. Wang SLAC, Menlo Park, California, USA
	We discuss the progress made on a new installation in Fermilab’s Main Injector that will help investigate the electron cloud phenomenon by making direct measurements of the secondary electron yield (SEY) of samples irradiated in the accelerator. In the Project X upgrade the Main Injector will have its beam intensity increased by a factor of three compared to current operations. This may result in the beam being subject to instabilities from the electron cloud. Measured SEY values can be used to further constrain simulations and aid our extrapolation to Project X intensities. The SEY test-stand, developed in conjunction with Cornell and SLAC, is capable of measuring the SEY from samples using an incident electron beam when the samples are biased at different voltages. We present the design and manufacture of the test-stand and the results of initial laboratory tests on samples prior to installation.

Paper

Title

Page

Secondary Electron Yield Measurements of Fermilab’s Main Injector Vacuum Vessel

166

D.J. Scott, D. Capista, K.L. Duel, R.M. Zwaska
Fermilab, Batavia, USA
S. Greenwald, W. Hartung, Y. Li, T.P. Moore, M.A. Palmer
CLASSE, Ithaca, New York, USA
R.E. Kirby, M.T.F. Pivi, L. Wang
SLAC, Menlo Park, California, USA

We discuss the progress made on a new installation in Fermilab’s Main Injector that will help investigate the electron cloud phenomenon by making direct measurements of the secondary electron yield (SEY) of samples irradiated in the accelerator. In the Project X upgrade the Main Injector will have its beam intensity increased by a factor of three compared to current operations. This may result in the beam being subject to instabilities from the electron cloud. Measured SEY values can be used to further constrain simulations and aid our extrapolation to Project X intensities. The SEY test-stand, developed in conjunction with Cornell and SLAC, is capable of measuring the SEY from samples using an incident electron beam when the samples are biased at different voltages. We present the design and manufacture of the test-stand and the results of initial laboratory tests on samples prior to installation.