Author: Hartill, D.L.
Paper Title Page
MOPPR079 Horizontal Beam-size Measurements at CESR-TA Using Synchrotron-light Interferometer 972
  • S. Wang, J.V. Conway, D.L. Hartill, M.A. Palmer, D. L. Rubin
    CLASSE, Ithaca, New York, USA
  • R.F. Campbell, R. Holtzapple
    CalPoly, San Luis Obispo, California, USA
  Funding: DOE Award DE-FC02-08ER41538 NSF Award (PHY-0734867) NSF Award (PHY-1002467) NSF Award (PHY-1068662).
A horizontal beam profile monitor utilizing visible synchrotron radiation from a bending magnet has been designed and installed in CESR. The monitor employs a double-slit interferometer which has been successfully implemented to measure horizontal beam sizes over a wide range of beam currents. By varying the separation of the slits, beam sizes ranging from 50 to 500 microns can be measured with a resolution of approximately 5 microns. The method for extracting the horizontal beam size from the interference pattern is presented and its application to intrabeam scattering studies is described. A configuration for measuring the small vertical beam size is also discussed.
WEPPC069 Construction, Evaluation, and Application of a Temperature Map for Multi-cell SRF Cavities 2369
  • G.M. Ge, F. Furuta, D.L. Hartill, K.M.V. Ho, G.H. Hoffstaetter, E.N. Smith
    CLASSE, Ithaca, New York, USA
  Temperature mapping (T-mapping) system is able to locate hot-spot of SRF cavity, thus it is a very powerful tool for cavity’s Q-value research. Recently Cornell University is developing a T-mapping system for multi-cell SRF cavities. The system includes more than two thousands Allen-Bradley resistors. Electronic of the system uses multiplexing of sensors which is able to dramatically reduce wire numbers, and allow the whole system is feasible for multi-cell cavity application. A new cavity testing insert which is for T-mapping system has been constructed.