Author: Dowell, D.
Paper Title Page
TUPPP087 Commissioning of the Fritz Haber Institute Mid-IR FEL 1792
 
  • A.M.M. Todd, H. Bluem, D. Dowell, R. Lange, J.H. Park, J. Rathke, L.M. Young
    AES, Medford, NY, USA
  • W. Erlebach, S. Gewinner, H. Junkes, A. Liedke, G. Meijer, W. Schöllkopf, W.Q. Zhang, G. von Helden
    FHI, Berlin, Germany
  • S.C. Gottschalk
    STI, Washington, USA
  • K. Jordan
    Kevin Jordan PE, Newport News, Virginia, USA
  • U. Lehnert, P. Michel, W. Seidel
    HZDR, Dresden, Germany
  • R. Wünsch
    FZD, Dresden, Germany
 
  The IR and THz FEL at the Fritz Haber Institute (FHI) in Berlin is designed to deliver radiation from 4 to 400 microns. A single-plane-focusing undulator combined with a 5.4-m-long cavity is used is the mid-IR (< 50 micron), while a two-plane-focusing undulator in combination with a 7.2-m-long cavity with a 1-D waveguide for the optical mode is planned for the far-IR. Beam was delivered to the IR beam dump in November 2011. We describe progress since that time in completing the commissioning of the mid-IR beamline and the status of the far-IR beamline design and fabrication.  
 
MOPPP041 Effect of Roughness on Emittance of Potassium Cesium Antimonide Photocathodes 655
 
  • T. Vecchione, J. Feng, H.A. Padmore, W. Wan
    LBNL, Berkeley, California, USA
  • I. Ben-Zvi, M. Ruiz-Osés, L. Xue
    Stony Brook University, Stony Brook, USA
  • D. Dowell
    SLAC, Menlo Park, California, USA
  • T. Rao, J. Smedley
    BNL, Upton, Long Island, New York, USA
 
  Funding: This work was supported by the Director, Office of Science, Office of Basic Energy Sciences of the U. S. Department of Energy, under Contract DE-AC02-05CH11231, KC0407-ALSJNT-I0013, and DE-SC0005713
Here we present first measurements of the effect of roughness on the emittance of K2CsSb photocathodes under high fields. We show that for very thin cathodes the effect is negligible at up to 3 MV/m but for thicker and more efficient cathodes the effect becomes significant. We discuss ways to modify the deposition to circumvent this problem.