Author: Aronson, J.N.
Paper Title Page
TUPPC056 Optics Measurements and Corrections at RHIC 1299
 
  • M. Bai, J.N. Aronson, M. Blaskiewicz, Y. Luo, V.H. Ranjbar, G. Robert-Demolaize, S.M. White
    BNL, Upton, Long Island, New York, USA
  • G. Vanbavinckhove
    CERN, Geneva, Switzerland
 
  Funding: Work supported by Brookhaven Science Associates, LLC under Contract No. DE-AC02-98CH10886 with the U.S. Department of Energy.
The further improvement of RHIC luminosity performance requires more precise understanding of the RHIC modeling. Hence, it is necessary to minimize the beta-beat, deviation of measured beta function from the calculated beta functions based on an model. The correction of beta-beat also opens up the possibility of exploring operating RHIC polarized protons at a working point near integer, a preferred choice for both luminosity as well as beam polarization. The segment-by-segment technique for reducing beta-beat demonstrated in the LHC operation for reducing the beta-beat was first tested in RHIC during its polarized proton operation in 2011. It was then fully implemented during the RHIC polarized proton operation in 2012. This paper reports the commissioning results. Future plan is also presented.
 
 
WEPPD084 The E-Lens Test Bench for Rhic Beam-Beam Compensation 2720
 
  • X. Gu, Z. Altinbas, J.N. Aronson, E.N. Beebe, W. Fischer, D.M. Gassner, K. Hamdi, J. Hock, L.T. Hoff, P. Kankiya, R.F. Lambiase, Y. Luo, M. Mapes, J.-L. Mi, T.A. Miller, C. Montag, S. Nemesure, M. Okamura, R.H. Olsen, A.I. Pikin, D. Raparia, P.J. Rosas, J. Sandberg, Y. Tan, C. Theisen, P. Thieberger, J.E. Tuozzolo, W. Zhang
    BNL, Upton, Long Island, New York, USA
 
  Funding: Work supported by Brookhaven Science Associates, LLC under Contract No. DE-AC02-98CH10886 with the U.S. Department of Energy.
To compensate for the beam-beam effects from the proton-proton interactions at IP6 and IP8 in the Relativistic Heavy Ion Collider (RHIC), we are fabricating two electron lenses that we plan to install at RHIC IR10. Before installing the e-lenses, we are setting-up the e-lens test bench to test the electron gun, collector, GS1 coil, modulator, partial control system, some instrumentation, and the application software. Some e-lens power supplies, the electronics for current measurement will also be qualified on test bench. The test bench also was designed for measuring the properties of the cathode and the profile of the beam. In this paper, we introduce the layout and elements of the e-lens test bench; and we discuss its present status towards the end of this paper.