| Paper |
Title |
Page |
| THPHA031 |
Fast Image Analysis for Beam Profile Measurement at the European XFEL |
1416 |
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- J. Wilgen, B. Beutner
DESY, Hamburg, Germany
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At the European XFEL, images of scintillator screens are processed at a rate of 10 Hz. Dedicated image analysis servers are used for transversal beam profile analysis as well as for longitudinal profile and slice emittance measurement. This contribution describes the setup and the algorithms used for image analysis.
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Poster THPHA031 [1.161 MB]
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| DOI • |
reference for this paper
※ https://doi.org/10.18429/JACoW-ICALEPCS2017-THPHA031
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| THPHA116 |
Emittance Measurement and Optics Matching at the European XFEL |
1655 |
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- S.M. Meykopff, B. Beutner
DESY, Hamburg, Germany
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Electron beam quality described by the emittance or phase space moments are important for the operation of FEL facilities like the European XFEL. For the operation these parameters need to be routinely measured. Based on such measurements machine setup can be optimized to match beam requirements. The beam parameters depend on parameters like quadrupole magnet strength or RF settings. While manual tuning is possible, we aim for highly automatized procedures to obtain such optimizations. In this paper we will present and discuss an overview of the different subsystems which are involved. These include image acquisition, analysis, and optics calculations as well as machine control user interfaces.
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| DOI • |
reference for this paper
※ https://doi.org/10.18429/JACoW-ICALEPCS2017-THPHA116
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| Export • |
reference for this paper using
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※ LaTeX,
※ Text/Word,
※ RIS,
※ EndNote (xml)
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