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RIS citation export for WEBPL02: On-Axis 3D Microscope for X-Ray Beamlines at NSLS-II

TY - CONF
AU - Gofron, K.J.
AU - Cai, Y.Q.
AU - Wlodek, J.
ED - Schaa, Volker RW
ED - Costa, Isidre
ED - Fernández, David
ED - Matilla, Óscar
TI - On-Axis 3D Microscope for X-Ray Beamlines at NSLS-II
J2 - Proc. of ICALEPCS2017, Barcelona, Spain, 8-13 October 2017
C1 - Barcelona, Spain
T2 - International Conference on Accelerator and Large Experimental Control Systems
T3 - 16
LA - english
AB - A series of versatile on-axis X-ray microscopes with large working distances, high resolution and large magnification have been developed for in-situ sample alignment and X-ray beam visualization at beam-lines at NSLS-II [1]. The microscopes use reflective optics, which minimizes dispersion, and allows imaging from Ultraviolet (UV) to Infrared (IR) with specifically chosen objective components (coatings, etc.) [2]. Currently over seven reflective microscopes have been procured with several installed at NSLS2 beam-lines. Additional customizations can be implemented providing for example dual-view with high/low magnification, 3-D imaging, long working range, as well as ruby pressure system measurement. The microscope camera control frequently utilizes EPICS areaDetector. In specialized applications python programs integrate EPICS camera control, with computer vision, and EPICS motion control for goniostat centering or object detection applications.
PB - JACoW
CP - Geneva, Switzerland
SP - 1048
EP - 1053
KW - ion
KW - alignment
KW - optics
KW - detector
KW - EPICS
DA - 2018/01
PY - 2018
SN - 978-3-95450-193-9
DO - 10.18429/JACoW-ICALEPCS2017-WEBPL02
UR - http://jacow.org/icalepcs2017/papers/webpl02.pdf
ER -