IAP, Frankfurt am Main, Germany
GSI, Darmstadt, Germany
At the heavy ion LINAC at GSI, a novel scheme of non-invasive Bunch Shape Monitor has been tested with several ions beam at 11.4 MeV/u and beam current in the range from 80 μA to 1000 μA. Caused by the beam impact on the residual gas, secondary electrons are liberated. These electrons are accelerated by an electrostatic field, transported through a sophisticated electrostatic energy analyzer and an rf-deflector, acting as a time-to-space converter. Finally a MCP amplifies the electrons and the electron distribution is detected by a CCD camera. For the applied beam settings this Bunch Shape Monitor is able to obtain longitudinal profiles down to of 250 ps RMS width with an RMS resolution of 34 ps, corresponding to 0.5° of the 36 MHz acceleration frequency. Systematic parameter studies, for the device were performed to demonstrate the applicability and to determine the achievable resolution. The background contribution, as orginated by x-rays, are investigated.
