IBIC2014 - List of Authors (Takao, M.)

Paper	Title	Page
TUCZB1	Novel Emittance Diagnostics for Diffraction Limited Light Sources Based on X-ray Fresnel Diffractometry	274
	M. Masaki, Y. Shimosaki, S. Takano, M. Takao JASRI/SPring-8, Hyogo-ken, Japan
	A novel emittance diagnostics technique with high sensitivity using X-ray Fresnel diffraction by a single slit has been developed to measure micron-order electron beam sizes at insertion devices (IDs) of photon beamlines. The X-ray Fresnel diffractometry (XFD)* is promising for diagnostics especially of a so-called diffraction limited storage ring (DLSR) with ultra-low emittance. In the DLSR, due to inevitable field errors of strong quadrupole and sextupole magnets, unwanted distortion of lattice functions and local betatron coupling will result in a different light source size at each beamline. Therefore, measurements of electron beam sizes at the ID source points will be essential to ensure the absence of degradation of brilliance and transverse coherence of radiation at the beamlines. The XFD observes a double-lobed diffraction pattern that emerges by optimizing the single slit width. The principle is based on a correlation between the depth of a median dip in the double-lobed pattern and the light source size at the ID. The validity of the new technique was theoretically and experimentally studied. The achievable resolution of the XFD will be also discussed. * M. Masaki, et al.,"X-ray Fresnel Diffractometry for Ultra-Low Emittance Diagnostics of Next Generation Synchrotron Light Sources", submitted to Phys. Rev.ST-AB.
	Slides TUCZB1 [5.456 MB]
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Paper

Title

Page

Novel Emittance Diagnostics for Diffraction Limited Light Sources Based on X-ray Fresnel Diffractometry

274

M. Masaki, Y. Shimosaki, S. Takano, M. Takao
JASRI/SPring-8, Hyogo-ken, Japan

A novel emittance diagnostics technique with high sensitivity using X-ray Fresnel diffraction by a single slit has been developed to measure micron-order electron beam sizes at insertion devices (IDs) of photon beamlines. The X-ray Fresnel diffractometry (XFD)* is promising for diagnostics especially of a so-called diffraction limited storage ring (DLSR) with ultra-low emittance. In the DLSR, due to inevitable field errors of strong quadrupole and sextupole magnets, unwanted distortion of lattice functions and local betatron coupling will result in a different light source size at each beamline. Therefore, measurements of electron beam sizes at the ID source points will be essential to ensure the absence of degradation of brilliance and transverse coherence of radiation at the beamlines. The XFD observes a double-lobed diffraction pattern that emerges by optimizing the single slit width. The principle is based on a correlation between the depth of a median dip in the double-lobed pattern and the light source size at the ID. The validity of the new technique was theoretically and experimentally studied. The achievable resolution of the XFD will be also discussed.
* M. Masaki, et al.,"X-ray Fresnel Diffractometry for Ultra-Low Emittance Diagnostics of Next Generation Synchrotron Light Sources", submitted to Phys. Rev.ST-AB.

Slides TUCZB1 [5.456 MB]

Export •

reference for this paper to ※ LaTeX, ※ Text, ※ IS/RefMan, ※ EndNote (xml)