TY - CPAPER
AU - Andre, C.
AU - Forck, P.
AU - Haseitl, R.
AU - Reiter, A.
AU - Singh, R.
AU - Walasek-Höhne, B.
TI - Optimization of Beam Induced Fluorescence Monitors for Profile Measurements of High Current Heavy Ion Beams at GSI
J2 - Proc. of IBIC2014
AB - To cope with the demands of the Facility for Antiproton and Ion Research (FAIR) for high current operation at the GSI Heavy Ion Linear Accelerator UNILAC non intercepting methods for transverse beam profile measurement are required. In addition to intercepting diagnostics like Secondary Electron Emission Grid (SEM-Grid) or scintillating screens, the Beam Induced Fluorescence (BIF) Monitor, an optical measurement device based on the observation of fluorescent light emitted by excited nitrogen molecules, was brought to routine operation. Starting with the first installations in 2008 and consequent improvements, successively six monitors were set up in the UNILAC and in the transfer line (TK) towards the synchrotron SIS18. BIF is used as a standard diagnostic tool to observe the ion beam at kinetic energies between 1.4 and 11.4 MeV/u. Beside the standard operation mode where the gas pressure is varied, further detailed investigations were conducted. The BIF setups were tested with various beam parameters. Different settings of camera, optics and image intensification were applied to improve the image quality for data analysis. In parallel, the light yield from different setups was compared for various ions, charge states, beam energies and particle numbers.
PB - JACoW
CY - Geneva, Switzerland
SP - 412
EP - 416
KW - detector
KW - ion
KW - operation
KW - background
KW - experiment
DA - 2014/10
PY - 2014
SN - 978-3-95450-141-0
UR - http://jacow.org/IBIC2014/papers/tupd05.pdf
ER -