TY - CPAPER
AU - Miller, T.A.
AU - Costanzo, M.R.
AU - Fischer, W.
AU - Frak, B.
AU - Gassner, D.M.
AU - Gu, X.
AU - Pikin, A.I.
TI - Beam Profile Measurements in the RHIC Electron Lens using a Pinhole Detector and YAG Screen
J2 - Proc. of IBIC2014
AB - The electron lenses installed in RHIC are equipped with two independent transverse beam profiling systems, namely the Pinhole Detector and YAG screen. A small Faraday cup, with a 0.2mm pinhole mask, intercepts the electron beam while a pre-programmed routine automatically raster scans the beam across the detector face. The collected charge is integrated, digitized and stored in an image type data file that represents the electron beam density. This plungeable detector shares space in the vacuum chamber with a plunging YAG:Ce crystal coated with aluminum. A view port at the downstream extremity of the Collector allows a GigE camera, fitted with a zoom lens, to image the crystal and digitize the profile of a beam pulse. Custom beam profiling software has been written to import both beam image files (pinhole and YAG) and fully characterize the transverse beam profile. The results of these profile measurements are presented here along with a description of the system and operational features.
PB - JACoW
CY - Geneva, Switzerland
SP - 59
EP - 63
KW - electron
KW - controls
KW - software
KW - detector
KW - timing
DA - 2014/10
PY - 2014
SN - 978-3-95450-141-0
UR - http://jacow.org/IBIC2014/papers/mopf08.pdf
ER -