IBIC2013 - List of Authors (Sosa, A.G.)

Paper

Title

Page

Secondary Emission Monitor for keV Ion and Antiproton Beams

495

A.G. Sosa, E. Bravin, A. Jeff
CERN, Geneva, Switzerland
J. Harasimowicz, A. Jeff, A.G. Sosa, C.P. Welsch
Cockcroft Institute, Warrington, Cheshire, United Kingdom
J. Harasimowicz, A. Jeff, A.G. Sosa, C.P. Welsch
The University of Liverpool, Liverpool, United Kingdom

Funding: Work supported by the EU within the DITANET and CATHI projects under contracts 215080 and 264330, HGF and GSI under contract VH-NG-328 and STFC under the Cockcroft Institute core grant ST/G008248/1.
Beam profile monitoring of low intensity keV ion and antiproton beams remains a challenging task. A Secondary electron Emission Monitor (SEM) has been designed to measure profiles of beams with intensities below 10⁷ and energies as low as 20 keV. The monitor is based on a two stage microchannel plate (MCP) and a phosphor screen facing a CCD camera. Its modular design allows two different operational setups. In this contribution we present the design of a prototype and discuss results from measurements with protons at INFN-LNF and antiprotons at the AEgIS experiment at CERN*. This is then used for a characterization of the monitor with regard to its possible future use at different facilities.
* Measurements at the AD carried out with the AEgIS collaboration.

Poster TUPF02 [1.934 MB]

Paper	Title	Page
TUPF02	Secondary Emission Monitor for keV Ion and Antiproton Beams	495
	A.G. Sosa, E. Bravin, A. Jeff CERN, Geneva, Switzerland J. Harasimowicz, A. Jeff, A.G. Sosa, C.P. Welsch Cockcroft Institute, Warrington, Cheshire, United Kingdom J. Harasimowicz, A. Jeff, A.G. Sosa, C.P. Welsch The University of Liverpool, Liverpool, United Kingdom
	Funding: Work supported by the EU within the DITANET and CATHI projects under contracts 215080 and 264330, HGF and GSI under contract VH-NG-328 and STFC under the Cockcroft Institute core grant ST/G008248/1. Beam profile monitoring of low intensity keV ion and antiproton beams remains a challenging task. A Secondary electron Emission Monitor (SEM) has been designed to measure profiles of beams with intensities below 10⁷ and energies as low as 20 keV. The monitor is based on a two stage microchannel plate (MCP) and a phosphor screen facing a CCD camera. Its modular design allows two different operational setups. In this contribution we present the design of a prototype and discuss results from measurements with protons at INFN-LNF and antiprotons at the AEgIS experiment at CERN. This is then used for a characterization of the monitor with regard to its possible future use at different facilities. Measurements at the AD carried out with the AEgIS collaboration.
	Poster TUPF02 [1.934 MB]