|TUPF02||Secondary Emission Monitor for keV Ion and Antiproton Beams||495|
Funding: Work supported by the EU within the DITANET and CATHI projects under contracts 215080 and 264330, HGF and GSI under contract VH-NG-328 and STFC under the Cockcroft Institute core grant ST/G008248/1.
Beam profile monitoring of low intensity keV ion and antiproton beams remains a challenging task. A Secondary electron Emission Monitor (SEM) has been designed to measure profiles of beams with intensities below 107 and energies as low as 20 keV. The monitor is based on a two stage microchannel plate (MCP) and a phosphor screen facing a CCD camera. Its modular design allows two different operational setups. In this contribution we present the design of a prototype and discuss results from measurements with protons at INFN-LNF and antiprotons at the AEgIS experiment at CERN*. This is then used for a characterization of the monitor with regard to its possible future use at different facilities.
* Measurements at the AD carried out with the AEgIS collaboration.
|Poster TUPF02 [1.934 MB]|