Author: Rider, N.T.
Paper Title Page
WEPF15 High-Power Tests at CesrTA of X-ray Optics Elements for SuperKEKB 844
  • J.W. Flanagan, A. Arinaga, H. Fukuma, H. Ikeda
    KEK, Ibaraki, Japan
  • A. Lyndaker, D.P. Peterson, N.T. Rider
    Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
  X-ray beam size monitors at SuperKEKB must withstand high, sustained incident power loads. Two prototype optics elements were fabricated and tested at CesrTA, using incident X-ray power densities comparable to those expected at the SuperKEKB LER. One element was based on a silicon substrate, the other a CVD diamond substrate, with each substrate supporting a coded aperture mask pattern in gold on its surface. The diamond substrate mask showed superior performance to the silicon substrate mask, with the the mask pattern on the silicon substrate melting at the highest incident power level tested, where the diamond-substrate mask survived. We will present here the high-power test results, along with analysis of X-ray power absorption and heat transfer in the two prototype elements, and the resulting implications for the design of the optics, beam line and heat sink for SuperKEKB.