Author: Huang, G.Q.
Paper Title Page
TUPF17 Phase Space Measurement using X-ray Pinhole Camera at SSRF 539
  • K.R. Ye, J. Chen, Z.C. Chen, G.Q. Huang, Y.B. Leng, L.Y. Yu, W.M. Zhou
    SINAP, Shanghai, People's Republic of China
  Since 2009 an X-ray pinhole camera that has been used to present the transverse beam size on diagnostic beamline of the storage ring in Shanghai Synchrotron Radiation Facility (SSRF). Transverse beam profiles in the real(x,y) and phase(Y,Y’) spaces are obtained by an X-ray pinhole camera sensitive by moving one pinhole. The large amount of collected data has allowed a detailed reconstruction of the transverse phase space evolution in this paper. An image on a fluorescent screen is observed by a CCD camera,digitized and stored, then the phase space and the real space profiles are reconstructed.A non-linear least square program fits the resultant profiles to a vertical dimensional Gaussian distributions to derive the phase space and emittances for SSRF storage ring.