Author: Guetlich, E.     [Gütlich, E.]
Paper Title Page
MOPF13 Transverse Beam Profiling for FAIR 232
  • M. Schwickert, C.A. Andre, F. Becker, P. Forck, T. Giacomini, E. Gütlich, T. Hoffmann, A. Lieberwirth, S. Löchner, A. Reiter, B. Voss, B. Walasek-Höhne, M. Witthaus
    GSI, Darmstadt, Germany
  The FAIR facility will provide intense primary beams of protons and heavy ions, or secondary beams of antiproton and rare isotopes. The operation includes fixed-target experiments or subsequent facilities of independent storage rings and experiment beam lines. The particle beams greatly differ in ion species, intensity, time structure, spot size and stopping power. Therefore, transverse beam profile measurements require a careful choice of detector type for each location in order to cope with the large dynamic range and operational demands. This contribution presents the actual status of FAIR detector developments for intercepting devices (SEM-Grids, Multi-Wire Proportional Chambers, Scintillating Screens) as well as non-intercepting Beam Induced Fluorescence Monitors and Ionization Profile Monitors. Recently, promising results were obtained with slow extracted heavy ion beams in measurements of optical transmission radiation emitted from thin metal foils. The boundaries for the application area are described and basic detector parameters are summarized.  
MOPF14 Scintillation Screen Response to Heavy Ion Impact 235
  • E. Gütlich, O.K. Kester
    IAP, Frankfurt am Main, Germany
  • P. Forck, O.K. Kester
    GSI, Darmstadt, Germany
  For quantitative transverse ion beam profile measurement, imaging properties of scintillation screens have been investigated for the working conditions of the GSI linear accelerator. In the ion energy range between 4.8 and 11.4 MeV/u the imaging properties of the screens are compared with profiles obtained using standard techniques like SEM grids and scraper. Detailed investigations with e.g. Calcium and Argon ion beams on various radiation-hard materials show that the measured beam profiles can differ from those measured with standard methods and depend on several beam and material parameters *. For the practical usage of scintillators, it is necessary to have predictions for the response of the scintillator to a given ion beam. An existing model for the light output of scintillators for single particle irradiation has been extended to include the effect of overlapping excitation tracks. To validate the model, dedicated measurements with well-defined Carbon and Titanium ion beams at 11.4 MeV/u have been carried out. To understand the mechanisms, the beam flux and the pulse length has been varied. The measured light yield is compared to the model calculations.
* E. Gütlich et al., “Scintillation screen studies for high dose ion beam applications”, IEEE Transactions on Nuclear Science, Vol. 59, No. 5, October 2012, pp. 2354 – 2359.
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