Author: Becker, F.
Paper Title Page
MOPF13 Transverse Beam Profiling for FAIR 232
  • M. Schwickert, C.A. Andre, F. Becker, P. Forck, T. Giacomini, E. Gütlich, T. Hoffmann, A. Lieberwirth, S. Löchner, A. Reiter, B. Voss, B. Walasek-Höhne, M. Witthaus
    GSI, Darmstadt, Germany
  The FAIR facility will provide intense primary beams of protons and heavy ions, or secondary beams of antiproton and rare isotopes. The operation includes fixed-target experiments or subsequent facilities of independent storage rings and experiment beam lines. The particle beams greatly differ in ion species, intensity, time structure, spot size and stopping power. Therefore, transverse beam profile measurements require a careful choice of detector type for each location in order to cope with the large dynamic range and operational demands. This contribution presents the actual status of FAIR detector developments for intercepting devices (SEM-Grids, Multi-Wire Proportional Chambers, Scintillating Screens) as well as non-intercepting Beam Induced Fluorescence Monitors and Ionization Profile Monitors. Recently, promising results were obtained with slow extracted heavy ion beams in measurements of optical transmission radiation emitted from thin metal foils. The boundaries for the application area are described and basic detector parameters are summarized.