Author: Albertone, J.
Paper Title Page
WEPC11 Radiation Resistance Testing of Commercial Components for the New SPS Beam Position Measurement System 686
  • C. Deplano, J. Albertone, T.B. Bogey, J.L. Gonzalez, J.-J. Savioz
    CERN, Geneva, Switzerland
  A new Front-End (FE) electronics is under development for the SPS Multi Orbit POsition System (MOPOS). To cover the large dynamic range of beam intensities (70dB) to be measured in the SPS, the beam position monitor signals are processed using logarithmic amplifiers. They are then digitized locally and transmitted via optical fibers over long distances (up to 1km) to VME acquisition boards located in surface buildings. The FE board is designed to be located in the SPS tunnel, where it must cope with a radiation dose rate of up to 100 Gy per year. Analogue components, such as Logarithmic Amplifiers, ADC-Drivers and Voltage regulators, have been tested at PSI for radiation hardness, while several families of bidirectional SFP, both single-fiber and double-fiber, have been tested at both PSI and CNRAD. This paper gives a description of the overall system architecture and presents the results of the radiation hardness tests in detail.  
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