IBIC2012 - List of Keywords (insertion-device)

Paper	Title	Other Keywords	Page
MOPA24	Photon Beam Position Monitor at SIAM Photon Source	photon, undulator, insertion, electron	104
	P. Sudmuang, S. Boonsuya, S. Chaichuay, P. Klysubun, S. Krainara, H. Nakajima, S. Rugmai, N. Sumano, N. Suradet SLRI, Nakhon Ratchasima, Thailand
	Photon beam position monitors (PBPM) have been designed and installed in the beamline front-ends at Siam Photon Source (SPS). Up till now, these blade-type PBPMs have been successfully installed at three bending magnet and an insertion device (planar undulator) beamlines. Its performance has been tested and compared with that of the electron beam position monitor. The achieved resolution is found to be better than 3 μm. The obtained PBPM data proved to be extremely invaluable in the investigation of the sources of the observed beam positional fluctuation, and for compensation of the orbit perturbation caused by undulator gap change. In this paper, the details of the calibration procedure will be presented. Various factors affecting reading of the signal such as back scattering effect, choice of bias voltage, and temperature variation have been investigated and the results will be discussed herewith.

Paper

Title

Other Keywords

Page

MOPA24

Photon Beam Position Monitor at SIAM Photon Source

photon, undulator, insertion, electron

104

P. Sudmuang, S. Boonsuya, S. Chaichuay, P. Klysubun, S. Krainara, H. Nakajima, S. Rugmai, N. Sumano, N. Suradet
SLRI, Nakhon Ratchasima, Thailand

Photon beam position monitors (PBPM) have been designed and installed in the beamline front-ends at Siam Photon Source (SPS). Up till now, these blade-type PBPMs have been successfully installed at three bending magnet and an insertion device (planar undulator) beamlines. Its performance has been tested and compared with that of the electron beam position monitor. The achieved resolution is found to be better than 3 μm. The obtained PBPM data proved to be extremely invaluable in the investigation of the sources of the observed beam positional fluctuation, and for compensation of the orbit perturbation caused by undulator gap change. In this paper, the details of the calibration procedure will be presented. Various factors affecting reading of the signal such as back scattering effect, choice of bias voltage, and temperature variation have been investigated and the results will be discussed herewith.