Author: Trovati, S.
Paper Title Page
THP091 Design and Test of Wire-Scanners for SwissFEL 948
 
  • G.L. Orlandi, M. Baldinger, H. Brands, P. Heimgartner, R. Ischebeck, A. Kammerer, F. Löhl, R. Lüscher, P. Mohanmurthy, C. Ozkan, B. Rippstein, V. Schlott, L. Schulz, C. Seiler, S. Trovati, P. Valitutti, D. Zimoch
    PSI, Villigen PSI, Switzerland
 
  The Swiss­FEL light-fa­cil­ity will pro­vide co­her­ent X-rays in the wave­length re­gion 7-0.7 nm and 0.7-0.1 nm. In Swiss­FEL, view-screens and wire-scan­ners will be used to mon­i­tor the trans­verse pro­file of a 200/10pC elec­tron beam with a nor­mal­ized emit­tance of 0.4/0.2 mm.​mrad and a final en­ergy of 5.7 GeV. Com­pared to view screens, wire-scan­ners offer a quasi-non-de­struc­tive mon­i­tor­ing of the beam trans­verse pro­file with­out suf­fer­ing from pos­si­ble mi­cro-bunch­ing of the elec­tron beam. The main as­pects of the de­sign, lab­o­ra­tory char­ac­ter­i­za­tion and beam-test of the Swiss­FEL wire-scan­ner pro­to­type will be pre­sented.